Browsing by Author "Lai, Wei-Chih"

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An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film Transistors
(2019-06-01)
Chen, Guan-Fu
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Chen, Hong-Chih
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Chang, Ting-Chang
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Huang, Shin-Ping
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Chen, Hua-Mao
This paper clarifies the correct transmission mechanism, misattributed in the previous research, of a hydrogenated amorphous silicon thin-film transistor (a-Si:H TFT) device. Complete drain current-gate voltage (I-D-V-G) transfer characteristics including the forward and backward gate sweeps (gate voltage carried out in the OFF-state -> on-state and the ON-state -> OFF-state) are performed, and the physics models of an energy-band schematic are clearly explained. This paper reveals that the I-D-V-G curve stretch-out behavior of the subthreshold region is due to the leakage of the Poole-Frenkel region. At the Poole-Frenkel regions, electrons transfer to the drain terminal, and holes remain in the valance band of the a-Si:H bulk. The remaining holes represent the positive voltage and cause the electron barrier height lowering. This causes an increase in subthreshold current of the subthreshold region. Finally, three experiments are performed to prove the correctness of these models, and the a-Si TFTs device improvement methods will be proposed to enhance the stability and performance of product of the a-Si TFTs.
Development of a Multisite, Closed-loop Neuromodulator for the Theranosis of Neural Degenerative Diseases
(2018-01-01)
Chen, Hsin
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Chang, Yen-Chung
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Yeh, Shih-Rung
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Hsieh, Chih-Cheng
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Tang, Kea-Tiong
Stimulating specific brain regions has been found useful for treating neural disorders, such as the Parkinson's disease, epilepsy, depression, etc. However, how electrical stimulation modulates neural activities remains not fully understood. As animal models provide the advantage of recording and stimulating different disease-related regions simultaneously, this paper introduces the latest development of a multisite, closed-loop-controlled microsystem for investigating novel treatments on neural degenerative diseases with freely-moving rats. The algorithms for recognizing pathological neural activities automatically are also developed and realized in hardware, so as to control the stimulation in a closed loop and in real time. The pilot studies on the efficacy of treating the Parkinson's disease with closed-loop-controlled stimulation will be presented and discussed. Finally, the feasibility of modelling and probing how neural dynamics and connectivity are modulated by stimulation will be an important topic for future research.
Double superstructures in InGaN/GaN nano-pyramid arrays
(2015-10-01)
Chang, Chiao-Yun
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Li, Heng
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Hong, Kuo-Bin
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Yang, Ya-Yu
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Lai, Wei-Chih
We have fabricated and investigated InGaN/GaN nanopyramid arrays grown on c-plane sapphire by selective area growth technique. The double InGaN/GaN superstructures were formed in one GaN pyramid observed in transmittance emission microscopy. The two growth faces on GaN nanopyramind showed different growth rates, resulted in double superheterostructures of semi-polar facets for InGaN/GaN multiple quantum wells (MQWs) and c-plane InGaN/GaN nano-hetero-disk (NHD) under the nanoscale growth condition. The c-plane InGaN/GaN NHD had high Indium composition due to the pulling effect, exhibiting double wavelength emissions from GaN nanopyramid. And InGaN/GaN MQWs and c-plane InGaN/GaN NHD showed extremely low quantum confinement Stark effect, yielding great light emission efficiency. This result is beneficial for the development of blue, green and white light-emitting diodes. (C) 2015 Elsevier Ltd. All rights reserved.
Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
(2020-08-01)
Huang, Shin-Ping
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Chen, Hong-Chih
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Chen, Po-Hsun
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Zheng, Yu-Zhe
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Chu, Ann-Kuo
The extent of the poly-silicon crystalline protrusion, a result of differences in excimer laser annealing (ELA), affects the performance and reliability of thin-film transistors (TFTs). This study investigates the degradation mechanism of the low-temperature polycrystalline silicon (LTPS) TFT devices with differences in crystalline protrusion under self-heating stress (SHS). Higher ELA energy will induce higher protrusion height in the interface between the poly-silicon and gate insulator (GI). This surface morphology leads to serious charge trapping into the GI layers; in contrast, the smallest degradation after SHS can be seen in the devices with the lowest protrusion height. This indicates that the degradation is caused by the surface morphology between the poly-Si and GI interface. In addition, the COMSOL simulation results confirm that the large electric field in the GI layer appears in the rough surface morphology devices; therefore, choosing the appropriate ELA energy of the poly-Si is beneficial for the applications of the driving TFT in organic light-emitting diode (OLED) display in the manufacturing industry.
GaN-based light-emitting diodes with graphene/indium tin oxide transparent layer
(2014-03-10)
Lai, Wei-Chih
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Lin, Chih-Nan
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Lai, Yi-Chun
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Yu, Peichen
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Chi, Gou Chung
We have demonstrated a gallium nitride (GaN)-based green light-emitting diode (LED) with graphene/indium tin oxide (ITO) transparent contact. The ohmic characteristic of the p-GaN and graphene/ITO contact could be preformed by annealing at 500 degrees C for 5 min. The specific contact resistance of p-GaN/graphene/ITO (3.72E-3 Omega(center dot)cm(2)) is one order less than that of p-GaN/ITO. In addition, the 20-mA forward voltage of LEDs with graphene/ITO transparent (3.05 V) is 0.09 V lower than that of ITO LEDs (3.14 V). Besides, We have got an output power enhancement of 11% on LEDs with graphene/ITO transparent contact. (C)2014 Optical Society of America
Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors
(2019-10-01)
Huang, Shin-Ping
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Chen, Po-Hsun
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Chen, Hong-Chih
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Zheng, Yu-Zhe
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Chu, Ann-Kuo
This letter investigates variations in polycrystalline silicon thin film transistor (TFT) performance under illumination and negative bias temperature instability (NBTI) tests due to different dehydrogenation annealing temperatures during the fabrication process. The depth of the density of state (DOS) in polysilicon can be indirectly determined by the TFT response to light illumination, since dangling bonds act as recombination centers. The electrical characteristics of TFTs after undergoing NBTI can also be indicative of the bonding type of silicon atoms. By analyzing the results of these reliability tests, the type of DOS can be clarified, which is beneficial for realizing the relationship between performance and reliability.
Improved Output Power of InGaN LEDs by Lateral Overgrowth on Si-Implanted n-GaN Surface to Form Air Gaps
(2012-08-01)
Tu, Shang-Ju
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Lee, Ming-Lun
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Yeh, Yu-Hsiang
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Huang, Feng-Wen
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Chen, Po-Cheng
"In this paper, air gaps were embedded in the n-GaN layer to improve light output power of InGaN-based light-emitting diodes (LEDs). Si ions (Si+28) were implanted on the n-GaN surface, causing a lattice constant disorder. Therefore, the GaN grown on the Si-implanted areas had a lower growth rate than the implantation-free regions. Without using a dielectric thin film, lateral epitaxial overgrowth technique was used to form air gaps above the implanted regions and below the active layers of InGaN LEDs. We proposed the growth mechanisms of GaN layer on the Si-implanted GaN templates and characterized the InGaN-based LEDs with embedded air gaps array. With a 20-mA current injection, experimental results indicate that light output power (LOP) of the proposed LEDs was enhanced by 36%, compared with those of the conventional LEDs. This enhancement can be attributed to the light scattering at the textured GaN/gap interfaces to increase the effective light escape cone in the LEDs. Based on ray tracing simulation, if the height and the width of bottom of gaps were increased to 3 mu m, the Lop could be enhanced over 70%."
Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment
(2019-10-30)
Chen, Hong-Chih
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Kuo, Chuan-Wei
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Chang, Ting-Chang
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Lai, Wei-Chih
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Chen, Po-Hsun
In this study, the impact of moisture on the electrical characteristics of an amorphous In-Ga-Zn-O thin-film transistor (a-IGZO TFT) was investigated. In commercial applications of such TFTs, high stability and quality performance in humid environments are essential. During TFT operation under ambient moisture, the electrolysis of water molecules occurs via the tip electric field effect. Hydrogen diffuses from the etch-stop layer or back-channel into the main channel under a negative electric field. The hydrogen atoms act as shallow donors (which causes the carrier concentration in the channel to rise), causing the threshold voltage (V-TH) to shift in the negative direction. Hydrogen diffusion from the overlap of the source/drain and gate electrodes to the channel center caused by the tip electric field induces a significant barrier lowering and V-TH shifts in a short-channel device. However, under negative bias stress (NBS) in ambient moisture, the negative V-TH shift is more obvious in short- than in long-channel devices, indicating suppressed hydrogen diffusion in long-channel devices. This is attributed to the electrolysis of water by the tip electric field at the source, drain, and gate electrodes, which causes hydrogen to diffuse to the center of the channel. Here, a novel physical model of the capacitance-voltage (C-V) electrical property changes under ambient moisture is proposed, based on the early appearance of abnormalities in the C-V measurements. The electrolysis of water caused by the tip electric field and electrical abnormalities caused by hydrogen diffusion into the a-IGZO active layer are explained by this model. A secondary-ion mass spectrometry analysis shows that hydrogen content in the channel generally increases under NBS in ambient moisture. The degradation behavior due to moisture in a-IGZO is clarified. Thus, inhibiting the tip electric field may benefit future flexible-display and gas-sensing applications.
Light Emitting Diodes
(2015-01-01)
Lin, Chien-Chung
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Chen, Kuo-Ju
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Lin, Da-Wei
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Han, Hau-Vie
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Lai, Wei-Chih
Linear photon up-conversion of 450 meV in InGaN/GaN multiple quantum wells via Mn-doped GaN intermediate band photodetection
(2011-11-07)
Huang, Feng-Wen
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Sheu, Jinn-Kong
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Lee, Ming-Lun
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Tu, Shang-Ju
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Lai, Wei-Chih
Up-converted heterostructures with a Mn-doped GaN intermediate band photodetection layer and an InGaN/GaN multiple quantum well (MQW) luminescence layer grown by metal-organic vapor-phase epitaxy are demonstrated. The up-converters exhibit a significant up-converted photoluminescence (UPL) signal. Power-dependent UPL and spectral responses indicate that the UPL emission is due to photo-carrier injection from the Mn-doped GaN layer into InGaN/GaN MQWs. Photons convert from 2.54 to 2.99 eV via a single-photon absorption process to exhibit a linear up-conversion photon energy of similar to 450 meV without applying bias voltage. Therefore, the up-conversion process could be interpreted within the uncomplicated energy level model. (C) 2011 Optical Society of America
Optical properties of Mn in regrown GaN-based epitaxial layers
(2012-04-01)
Huang, Feng-Wen
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Sheu, Jinn-Kong
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Tu, Shang-Ju
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Chen, Po-Cheng
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Yeh, Yu-Hsiang
The memory effect and redistribution of manganese (Mn) into subsequently regrown GaN-based epitaxial layers by metalorganic chemical vapor deposition were revealed. Low-temperature up-converted photoluminescence (UPL) and the secondary ion mass spectrometry were performed on GaN-based epitaxial samples with and without Mn doping to study the effect of residual Mn on optical property. UPL emission, which originated from residual Mn doping in regrown InGaN quantum wells (QWs) because of the memory effect of the reactor, could be eliminated in an air-exposed and H-2-baking manner prior to the regrowth of the QWs. Considerable residual Mn background level and slow decay rate of Mn concentration tail were also observed in the regrown epitaxial layers, which could be attributed to the memory effect or surface segregation and diffusion from the Mn-doped underlying layer during regrowth in the Mn-free reactor. (C) 2012 Optical Society of America