Browsing by Author "Lai, Y. T. K."

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Industrial Anomaly Detection and One-class Classification using Generative Adversarial Networks
(2018-01-01)
Lai, Y. T. K.
;
Hu, J. S.
;
Tsai, Y. H.
;
Chiu, W. Y.
;
資訊工程學系
Industrial image datasets for quality inspection are mostly sparse in defects. It is then hard for both automated optical inspection (AOI) machines and simple neural network classifiers to inspect all defects effectively. In this work, we develop a novel framework for industrial anomaly detection in one-class classification manner, which utilized pre-trained generative adversarial networks (GANs) as the rule of thumb to perform anomaly detection. Our results show that GANs are able to capture arbitrary and structural industrial images and can effectively discern defects when the query images are defective.