Browsing by Author "Lee, Ching-Tung"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Item type:Item, Enhancement of the Schottky barrier height using a nitrogen-rich tungsten nitride thin film for the schottky contacts on AlGaN/GaN heterostructures(2008-05-01) ;Lu, Chung-Yu ;Chang, Edward Yi ;Huang, Jui-Chien ;Chang, Chia-TaLin, Mei-HsuanTungsten, stoichiometric W2N, and nitrogen-rich W2N films were used as Schottky contacts on AlGaN/GaN heterostructures. The nitrogen content in the film was controlled by varying the nitrogen-to-argon gas flow ratio during the reactive sputter deposition. The diode with the nitrogen-rich film exhibited a higher Schottky barrier height and the leakage current was comparable to that of the Ni/Au Schottky contact. Analysis suggested that this was due to the increase of the tungsten nitride work function as the result of higher nitrogen incorporation. Furthermore, after 600 degrees C thermal annealing, the diode was stable and showed no change in the leakage current.