Browsing by Author "Lee, Jui-Kan"

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1/f noise in micrometer-sized ultrathin indium tin oxide films
(2013-09-16)
Yeh, Sheng-Shiuan
;
Hsu, Wei-Ming
;
Lee, Jui-Kan
;
Lee, Yao-Jen
;
Lin, Juhn-Jong
We have measured the low-frequency noises of ultrathin indium tin oxide films to investigate the effect of post annealing on the noise level. The noises obtained obey an approximate 1/f law in the frequency range f approximate to 0.1-20 Hz. The microstructures and grain sizes of our films were altered by adjusting the annealing conditions. An enhancement of the noise level was observed for those samples comprising smaller grains, where numerous grain boundaries exist. This enhancement in the noise level is ascribed to atomic diffusion along grain boundaries or dynamics of two-level systems near the grain boundaries. (C) 2013 AIP Publishing LLC.
Free-electronlike diffusive thermopower of indium tin oxide thin films
(2010-12-15)
Wu, Chih-Yuan
;
Tra Vu Thanh
;
Chen, Yi-Fu
;
Lee, Jui-Kan
;
Lin, Juhn-Jong
We report our measurements of thermopower, S (T), on a series of indium tin oxide thin films from 300 down to 5 K to extract the carrier concentration n. The temperature behavior of S (T) below 300 K can be essentially described by a prevailing linear diffusive contribution. In this wide temperature interval, the phonon-drag thermopower is negligible relative to the diffusive thermopower. Therefore, the free-electronlike characteristic is clearly addressed. It should be stressed that linearity in S(d) from liquid-helium temperatures all the way up to room temperatures is seldom seen even in simple metals. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3524522]