Browsing by Author "Lee, KY"

Now showing 1 - 8 of 8

Analysis of a liquid crystal Fabry-Perot etalon filter: A novel model
(1997-04-01)
Chen, PL
;
Lin, KC
;
Chuang, WC
;
Tzeng, YC
;
Lee, KY
The authors propose a novel analysis method to investigate the characteristics of an electrically tunable liquid-crystal Fabry-Perot interferometer (LC-FPI), Based on the solution of deformation analysis of liquid crystal in an electric field and the assumption of small refractive index variation in the Fabry-Perot cavity, the voltage-dependent equivalent refractive index of the cavity has been derived. Tuning behaviors of the LC-FPI filter were simulated by means of the dependence, The calculated result and the experimental measured data agree well with each other.
Analysis of a liquid crystal Fabry-Perot etalon filter: A novel model
(1997-04-01)
Chen, PL
;
Lin, KC
;
Chuang, WC
;
Tzeng, YC
;
Lee, KY
The authors propose a novel analysis method to investigate the characteristics of an electrically tunable liquid-crystal Fabry-Perot interferometer (LC-FPI), Based on the solution of deformation analysis of liquid crystal in an electric field and the assumption of small refractive index variation in the Fabry-Perot cavity, the voltage-dependent equivalent refractive index of the cavity has been derived. Tuning behaviors of the LC-FPI filter were simulated by means of the dependence, The calculated result and the experimental measured data agree well with each other.
Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry
(2006-06-10)
Chao, YF
;
Lee, KY
;
Lin, YD
;
光電工程學系
;
Department of Photonics
The analytical solutions of the azimuthal deviation of a polarizer and an analyzer were obtained by polarizer-sample-analyzer ellipsometry with a three-intensity measurement technique. By performing two sets of this three-intensity measurement with the polarizer's azimuth set at 45 degrees and at -45 degrees, we were able to obtain a set of ellipsometric parameters free from the azimuthal deviations of the polarizer and the analyzer. (c) 2006 Optical Society of America.
Index profile of radial gradient index lens measured by imaging ellipsometric technique
(2005-02-01)
Chao, YF
;
Lee, KY
;
光電工程學系
;
Department of Photonics
A simple three-intensity imaging ellipsometric technique is proposed for measurement of the refractive index profile (RIP) of a radial gradient index (GRIN) lens. According to our numerical analysis, the improved ellipsometric parameters measured by this method are valid as long as the azimuth deviation of the polarizer is less than 3 degrees. A BK7 glass and a radial GRIN lens were measured. A fairly flat refractive index surface profile was obtained for the glass within a 0.3% error. The on-axis refractive index of the radial GRIN lens and its RIP are well fitted to the specifications provided by the manufacturer. Instead of the refracted-ray method, we provide a reflective and nondestructive measurement technique for measurement of the gradient index of a flat surface.
Picosecond photoresponse of carriers in Si ion-implanted Si
(1996-07-29)
Chin, A
;
Lee, KY
;
Lin, BC
;
Horng, S
;
電子工程學系及電子研究所
Picosecond photoresponse of carriers in Si ion-implanted Si samples has been measured using femtosecond transient reflectivity measurement. A threshold peak implant dose of 10(16) cm(-2) is required to achieve picosecond carrier lifetime. At this dosage, carrier lifetimes of 0.9 and 1.4 ps are measured for the as-implanted and 400 degrees C annealed Si substrates, respectively. The increase in carrier lifetime upon annealing is attributed to the reduction in the concentration of trap and recombination centers. Sheet resistance also shows a strong dependence on the annealing temperature. An eightfold increase in sheet resistance is obtained for annealed samples, and a reduction in hopping conduction, manifested by the e(-1/T) temperature dependence, may be responsible for the increase in resistance. Further evidence of decreasing hopping conduction can be also observed from the more than two orders of magnitude in reduction of sheet resistance as the peak dosage decreases from 10(16) to 10(14) cm(-2). (C) 1996 American Institute of Physics.
Structural amendment and stereoselective synthesis of mutisianthol
(1997-05-16)
Ho, TL
;
Lee, KY
;
Chen, CK
;
應用化學系
;
Department of Applied Chemistry
cis-1-(5-Acetoxy-3,6-dimethyl-1-indanyl)-2-methyl-1-propene synthesized from 3,6-dimethyl-1-indanone was found to be different from mutisianthol by spectral comparison. The presence of a high-field signal in the NMR spectrum of the final product and various intermediates, characteristic of the cis-1,3-dialkylindanes but absent in the spectrum of the natural terpene, suggests a revision of the structure of mutisianthol to the trans isomer. The trans-indane which was subsequently obtained indeed exhibits data fully agreeable with mutisianthol. A similar stereochemical revision for jungianol is also indicated.
Structural amendment and stereoselective synthesis of mutisianthol
(1997-05-16)
Ho, TL
;
Lee, KY
;
Chen, CK
;
交大名義發表
;
應用化學系
cis-1-(5-Acetoxy-3,6-dimethyl-1-indanyl)-2-methyl-1-propene synthesized from 3,6-dimethyl-1-indanone was found to be different from mutisianthol by spectral comparison. The presence of a high-field signal in the NMR spectrum of the final product and various intermediates, characteristic of the cis-1,3-dialkylindanes but absent in the spectrum of the natural terpene, suggests a revision of the structure of mutisianthol to the trans isomer. The trans-indane which was subsequently obtained indeed exhibits data fully agreeable with mutisianthol. A similar stereochemical revision for jungianol is also indicated.
The ellipsometric measurements of a curved surface
(2005)
Lee, KY
;
Chao, YF
;
光電工程學系
;
Department of Photonics
A three-intensity imaging ellipsometric technique is proposed to investigate the surface topography as well as the refractive index profile (RIP) of a lens. The azimuth deviation of polarizer caused by the tilting of a SiO2 thin film on Si substrate was investigated after a careful calibration on the azimuth position of polarizer of the water-surface. The azimuth deviation of polarizer is proved to be the local surface normal; thus we can determine not only the radius of curvature of a Plano-Convex lens from the measurement, but also its incident-angle-corrected RIP.