Browsing by Author "Lee, Lino"

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Current properties of GaNV-defect using conductive atomic force microscopy
(2006-08-01)
Lee, Lino
;
Ku, Ching-Shun
;
Ke, Wen-Cheng
;
Ho, Chih-Wei
;
Huang, Huai-Ying
Current conduction behavior on GaN V-defect was studied comprehensively using conductive atomic force microscopy. Experimental results indicate that the forward current in the V-defect region is at least three-order higher than that at surrounding area. On the other hand, a snowflake-like leakage current pattern was observed in the V-defect owing to the ease of current breakdown at the crest lines and perimeters. Further static current-voltage measurement suggests that the current flow is governed by Schottky emission and Fowler-Nordheim tunneling for V-defect region and surrounding area, respectively.