Browsing by Author "Li, Bin"

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Microwave and Millimeter-Wave Cryogenic Wideband LNA Design and Characterization
(2015)
Chen, Ying
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Li, Zheng-Kai
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Wu, Kun-Long
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Li, Bin
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Hu, Robert
-This manuscript reports our progress in designing wideband LNAs for use in radio-astronomical receivers. These include two WIN-150nm and five WIN-100nm GaAs pHEMT LNAs. Following a general description of design methodology, the LNAs\' simulated and measured results at room temperature will be presented. To make these LNAs eligible for low temperature applications, a cryogenic noise measurement system using multi-point variable-temperature-load (VTL) method is constructed where the system is computer controlled, and both the noise calibration and de-embedding concerns are properly addressed. At 14K ambient temperature, the 5-10GHz LNA has its averaged T. equal to 8K and the 8-20GHz LNA has its T. around 10K
OMMIC 70nm-mHEMT LNA Design
(2017-01-01)
Chen, Ying
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Wu, Kun-Long
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Huang, Ching-Ying
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Chang, Che-Kun
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Sun, Xin
This paper describes our progress in the design of cryogenic LNAs using OMMIC 70nm mHEMT for the Square Kilometer-Array (SKA) project and the Shanghai 65-Meter radio astronomical telescope. Different LNAs covering the aggregate 1 similar to 40GHz frequency range are designed and measured on-wafer at room temperature, and T-n for the 1 similar to 10, 5 similar to 15, and 10 similar to 40GHz LNAs are 80K, 90K, and 120K, respectively, with the gain all larger than 20dB. One 1 similar to 10GHz LNA chip is then packaged and tested cryogenically, and the noise temperature improvement factor is 6 similar to 8, which is smaller than what can be obtained from the WIN pHEMT. Performance repeatability among different chips has been carried out.
Using product data management technology to semiconductor manufacturing industry
(1970-01-01)
Li, Bin
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Chen, Ruey-Shun
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Chuang, Ci-Chu
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Tian, Yuan
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Al-Nabhan, Najla
Many enterprises cannot cost down and quality improve. So, speeding up production time is a new competition ability. Most Product Data Management (PDM) can automate to input files and data through known procedures. But some technology cannot satisfy the requirement for production information in precision, clearness and customization. This paper proposed a technique using application product data management on Integrated Circuit (IC) Design. Using internet, network and circuit simulation for solution problems, resulting from R&D process and the compatibility of customer required products. Using the proposed model in PDM to reduce the correction rate after the IC design and production in order to satisfy customers' demands. The results of this paper are the participating teams of strategic alliance can develop IC product to integrate enterprise subject to the related product quality. Support correct information of product for customer demands to develop relative products. Through the function of IC circuit simulation. The proposed model can verify customers' product instantly to reduce time and cost, and to increase the design efficiency and quality. The customer can use ICs products from building up IC courses. Using this technology can forecast customers' demands, development business trend and strengthen communicate with customers to build customer relationship, put IC products into the commercial market more quickly and enhance customer competition ability. Therefore, for ICs designer can get better product quality, shorten product R&D time and strengthen the competition ability.