Browsing by Author "Li, Chung-Wei"

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Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall
(2009-08-01)
Li, Chung-Wei
;
Tzeng, Gwo-Hshiung
;
科技管理研究所
;
Institute of Management of Technology
To deal with complex problems, structuring them through graphical representations and analyzing causal influences can aid in illuminating complex issues, systems, or concepts. The DEMATEL method is a methodology which can confirm interdependence among variables and aid in tire development of a chart to reflect interrelationships between variables, and can be used for researching and solving complicated and intertwined problem groups. The end product of the DEMATEL process is a visual representation-the impact-relations map-by which respondents organize their own actions in the world. In order to obtain a suitable impact-relations map, an appropriate threshold value is needed to obtain adequate information for further analysis and decision-making. In the existing literature, the threshold value has been determined through interviews with respondents or judged by the researcher. In most cases, it is hard and time-consuming to aggregate the respondents and make a consistent decision. In addition, in order to avoid subjective judgments, a theoretical method to select the threshold value is necessary. In this paper, we propose a method based on the entropy approach, the maximum mean de-entropy algorithm, to achieve this purpose. Using a real case to find the interrelationships between the services of a Semiconductor Intellectual Property Mall as an example, we will compare the results obtained from the respondents and from our method, and show that the impact-relations maps from these two methods could be the same. (C) 2009 Elsevier Ltd. All rights reserved.
Identification of interrelationship of key customers' needs based on structural model for services/capabilities provided by a Semiconductor-Intellectual-Property Mall
(2009-11-15)
Li, Chung-Wei
;
Tzeng, Gwo-Hshiung
;
科技管理研究所
;
Institute of Management of Technology
The semiconductor industry is shifting towards innovation and acquisition of intellectual property. Semiconductor-Intellectual-Property (SIP) design, a new industry, is also rapidly growing. This challenges both providers and users to develop infrastructure and standard interfaces. Establishing an SIP Mall to provide a full array of SIP business services is a new concept used to promote growth of the SIP industry. Many foundries and governments have been involved in setting up SIP Malls; however, the major services needed for an SIP Mall to attract SIP providers and SIP users must still be clarified. In this paper, the DEMATEL (DEcision MAking Trial and Evaluation Laboratory) method was used to discover and illustrate the key services needed to attract SIP users and SIP providers to an SIP Mall. Research enabled the derivation of the interrelated services and the structural interrelationship between them using the DEMATEL method. Overall, four key services were found to be vital for an SIP Mall to attract customers and to allocate resources efficiently. (C) 2009 Elsevier Inc. All rights reserved.