Browsing by Author "Li, K. C."
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Item type:Item, A Comprehensive Transport Model for High Performance HEMTs Considering the Parasitic Resistance and Capacitance Effects(2014) ;Hung, C. M. ;Li, K. C. ;Hsieh, E. R. ;Wang, C. T.Kou, C. I.HEMT suffers from parasitic resistance (R-sd) and capacitance(C-gd) effects with the shrinking of channel length, leading to degraded performance in logic and RF applications. A new while simple method to extract parasitic RC has been proposed to construct accurate transport parameters in HEMTs. In comparison to the constant-R-sd method, this new voltage dependent method provides more convincing results, especially for very short channel devices. On the other hand, an accurate C-gd correction method has also been incorporated to adequately represent the mobility. Finally, a guideline to design high performance HEMTs has been proposed.