Browsing by Author "Li, KSM"

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A unified approach to detecting crosstalk faults of interconnects in deep submicron VLSI
(2004)
Li, KSM
;
Lee, CL
;
Su, CC
;
Chen, JE
;
電子工程學系及電子研究所
The crosstalk fault effects in deep sub-micron VLSI, namely, glitches and the crosstalk-induced delay, are investigated. The origin of their occurrence, relationship and importance in circuit operation are elucidated. It is shown that the crosstalk-induced delay is only superposition of the induced glitch with the original signal delay on the affected victim line; and crosstalk-induced delay is more important in affecting the circuit performance, and should be considered in more details for testing. A scheme which is to detect both types of faults in a unified way by just detecting glitches is proposed and studied considering the manufacture process variation. In this way, detection of crosstalk-induced faults becomes much easier.
Finite state machine synthesis for at-speed oscillation testability
(2005)
Li, KSM
;
Lee, CL
;
Jiang, T
;
Su, CC
;
Chen, JE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing, which makes delay-inducing defects detectable. (2) The ATPG is much easier, and the test set is usually smaller. (3) There is no need to store output responses, which greatly reduces the communication bandwidth between the Automatic Test Equipment (ATE) and Circuit under Test (CUT). We provide a register design that supports the oscillation test, and give an effective algorithm for oscillation test generation. Experimental results on MCNC benchmarks show that the proposed test method achieves high fault coverage with smaller number of test vectors.