Browsing by Author "Liao, K. H."

Now showing 1 - 2 of 2

Pad Characterization for CMOS Technology Using Time Domain Reflectometry
(2008)
Chiu, C. S.
;
Chen, W. L.
;
Liao, K. H.
;
Chen, B. Y.
;
Teng, Y. M.
The pad structure of CMOS technology is characterized by way of time domain reflectometry measurement. Using the on-wafer TDR measurement system, the capacitance of the pad in the CMOS process was extracted and estimated. Measured and Simulated TDR data are also presented in this study. The capacitance is estimated when the curve is fitted by mathematical tool. This method is simple to use, and furthermore the results agree with data extracted from vector network analyzer.
Volume shrinkages and mechanical properties of various fiber-reinforced hydroxyethyl methacrylate-polyurethane/unsaturated polyester composites
(2008-03-01)
Lin, S. P.
;
Shen, J. H.
;
Han, J. L.
;
Lee, Y. J.
;
Liao, K. H.
In this study, two kinds of hydroxyethyl methacrylate-polyurethane (HEMA-PU) were used as volume shrinkage modifiers, and several hydroxyethyl methacrylate-polyurethane modified unsaturated polyester (HEMA-PU/St./UP) resins crosslinked with styrene were synthesized and characterized using Fourier transform infrared (FTIR) spectroscopy, scanning electron microscopy (SEM), and in terms of their mechanical properties, including their tensile strengths and lzod impact energies. The properties of the HEMA-PU-modified St./UP and St./UP were compared for potential applications as matrices for glass fiber-, aramid fiber-, and UHMWPE fiber-reinforced composites. The effects of the HEMA-PU content and the type of polyol in the HEMA-PU resin matrices of the composites were investigated through testing of their mechanical properties, bulletproof testing, and observations of their morphologies. (c) 2007 Elsevier Ltd. All rights reserved.