Browsing by Author "Liao, Ying-Yen"

Now showing 1 - 4 of 4

Detecting non-Markovian plasmonic band gaps in quantum dots using electron transport
(2009-06-01)
Chen, Yueh-Nan
;
Chen, Guang-Yin
;
Liao, Ying-Yen
;
Lambert, Neill
;
Nori, Franco
Placing a quantum dot close to a metal nanowire leads to drastic changes in its radiative decay behavior because of evanescent couplings to surface plasmons. We show how two non-Markovian effects, band edge and retardation, could be observed in such a system. Combined with a quantum-dot p-i-n junction, these effects could be readout via current-noise measurements. We also discuss how these effects can occur in similar systems with restricted geometries, such as phononic cavities and photonic crystal waveguides. This work links two previously separate topics: surface plasmons and current-noise measurements.
Mechanical properties of the hexagonal HoMnO(3) thin films by nanoindentation
(2010-10-22)
Yen, Cheng-Yo
;
Jian, Sheng-Rui
;
Lai, Yi-Shao
;
Yang, Ping-Feng
;
Liao, Ying-Yen
The structural and nanomechanical characteristics of the hexagonal HoMnO(3) (HMO) thin films are investigated by means of X-ray diffraction (XRD), atomic force microscopy (AFM) and nanoindentation techniques in this study. The HMO thin films were deposited on YSZ(1 1 1) substrates by pulsed laser deposition (PLD). The XRD results reveal only pure (0 0 0 1)-oriented hexagonal HMO reflections without any discernible traces of impurity or secondary phases. Nanoindentation results exhibit discontinuities in the load-displacement curve (so-called multiple "pop-ins" event) during loading, indicating possible involvement of dislocation activities. No discontinuities were observed on unloading segment of the load-displacement curve. Continuous stiffness measurements (CSM) technique was carried out in the nanoindentation tests to determine the hardness and Young's modulus of the hexagonal HMO thin films. The obtained hardness and Young's modulus of the hexagonal HMO thin films are 14.2 +/- 0.7 GPa and 219.2 +/- 10.6 GPa, respectively with the room-temperature fracture toughness being in the order of 0.4 +/- 0.2 MPa m(1/2). (c) 2010 Elsevier B.V. All rights reserved.
Mechanical properties of the hexagonal HoMnO3 thin films by nanoindentation
(2010-10-22)
Yen, Cheng-Yo
;
Jian, Sheng-Rui
;
Lai, Yi-Shao
;
Yang, Ping-Feng
;
Liao, Ying-Yen
The structural and nanomechanical characteristics of the hexagonal HoMnO3 (HMO) thin films are investigated by means of X-ray diffraction (XRD), atomic force microscopy (AFM) and nanoindentation techniques in this study. The HMO thin films were deposited on YSZ(1 1 1) substrates by pulsed laser deposition (PLD). The XRD results reveal only pure (0 0 0 1)-oriented hexagonal HMO reflections without any discernible traces of impurity or secondary phases. Nanoindentation results exhibit discontinuities in the load-displacement curve (so-called multiple "pop-ins" event) during loading, indicating possible involvement of dislocation activities. No discontinuities were observed on unloading segment of the load-displacement curve. Continuous stiffness measurements (CSM) technique was carried out in the nanoindentation tests to determine the hardness and Young's modulus of the hexagonal HMO thin films. The obtained hardness and Young's modulus of the hexagonal HMO thin films are 14.2 +/- 0.7 GPa and 219.2 +/- 10.6 GPa, respectively with the room-temperature fracture toughness being in the order of 0.4 +/- 0.2 MPa m(1/2). (c) 2010 Elsevier B.V. All rights reserved.
Nanomechanical properties of Bi2Te3 thin films by nanoindentation
(2015-01-15)
Tasi, Cheng-Hsun
;
Tseng, Yu-Chin
;
Jian, Sheng-Rui
;
Liao, Ying-Yen
;
Lin, Chih-Ming
In this study, the microstructural, morphological and nanomechanical properties of Bi2Te3 thin films are investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and nanoindentation techniques. The Bi2Te3 thin films were deposited on c-plane sapphire substrates using pulsed laser deposition (PLD) under the various helium gas pressures. The XRD results indicated that the Bi2Te3 thin films are textured with the c-axis preferentially oriented normal to the films surface. Both the grain size and surface roughness of the Bi2Te3 thin films exhibit an increasing trend with increasing the helium gas pressure. Furthermore, the hardness and Young\'s modulus of the Bi2Te3 thin films are measured by a Berkovich nanoindenter operated with the continuous contact stiffness measurements (CSM) mode were found to range from 2.92 +/- 0.12 to 4.02 +/- 0.14 GPa and from 106.31 +/- 0.63 to 127.46 +/- 9.21 GPa, respectively, when the helium gas pressure was increased from 2 x 10(-5) to 2 x 10(-3) Torr. (C) 2014 Elsevier B.V. All rights reserved.