Browsing by Author "Lin, Hsiu-Chuan"

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Connect6 Programs on Mobile Devices
(2012)
Zheng, Ji-Hong
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Hu, Chia-Yun
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Wu, I-Chen
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Tseng, Wen-Jie
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Wei, Ching-Hsuan
In this demonstration, we port our current Connect6 program, NCTU6, to mobile devices, such as iOS devices, Android devices. However, computing powers of mobile devices are also relatively weaker when compared with high-end machines. For example, the CPU speeds of mobile devices are about 1/5 to 1/8 of those of desktops; and the memory of mobile devices is usually limited to several megabytes. In this demonstration, we tune the program NCTU6 to fit in mobile devices, while maintaining reasonable strength. The program also won the silver medal in TCGA 2012. In addition, we also support Connect6 puzzles in the program.
On Reducing Test Power and Test Volume by Selective Pattern Compression Schemes
(2010-08-01)
Lin, Chia-Yi
;
Lin, Hsiu-Chuan
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Chen, Hung-Ming
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電子工程學系及電子研究所
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Department of Electronics Engineering and Institute of Electronics
In modern chip designs, test strategies are becoming one of the most important issues due to the increase of the test cost, among them we focus on the large test power dissipation and large test data volume. In this paper, we develop a methodology to suppress the test power to avoid chip failures caused by large test power, and our methodology is also effective in reducing the test data volume and shift-in power. The proposed schemes and techniques are based on the selective test pattern compression, they can reduce considerable shift-in power by skipping the switching signal passing through long scan chains. The experimental results with ISCAS89 circuits demonstrate that our methodology can achieve significant improvement in the reduction of shift-in power and test data volume. Our approach also supports multiple scan chains.