Browsing by Author "Lin, L. K."

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Analysis of the proximity effect and the interface transparency with perpendicular current in Ni/Nb system
(2009-04-01)
Huang, S. Y.
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Chiu, Y. C.
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Liang, J. J.
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Lin, L. K.
;
Tsai, T. C.
We quantitatively study the interface resistance in Ni/Nb multilayers fabricated by sputtering system. For a fixed Ni layer thickness in Ni/Nb/Ni trilayers, the superconducting temperature T(c) decreases with decreasing Nb thickness. By analyzing the data with the proximity effect, the critical thickness below which superconductivity vanished was deduced. From current perpendicular to plane (CPP) measurement interpreted with a one-band series-resistor model, we obtained the CPP resistivities of Nb and Ni and the unit area resistances of 4.2 +/- 0.2 and 1.5 +/- 0.4 f Omega m(2) for superconducting and normal Ni/ Nb interfaces. The transparency parameter is directly calculated in terms of interface resistance. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3073657]
Dimensional crossover and flux pinning of decoupled Cu(50)Ni(50)/Nb multilayers
(2008-04-01)
Huang, S. Y.
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Liang, J. -J.
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Tsai, T. C.
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Lin, L. K.
;
Lin, M. S.
The behaviors of superconducting transition temperature T(c) and upper critical field H(c2) as a function of different superconductor thicknesses have been investigated in Cu(50)Ni(50)/Nb trilayers and multilayers. We deduced superconductor critical thickness, below which superconductivity vanishes, by analyzing the data in terms of proximity theory. The temperature dependence of H(c2) measurement reveals the spatial dimensional crossover and the flux pinning mechanism in the superconductor. A strong pair-breaking effect was observed in the weak ferromagnetic Cu(50)Ni(50) layers from both measurements. We attribute our observation to the high interface transparency between Cu(50)Ni(50) and Nb. (C) 2008 American Institute of Physics.
Investigation of Cu(0.5)Ni(0.5)/Nb interface transparency by using current-perpendicular-to-plane measurement
(2011-01-01)
Huang, S. Y.
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Liang, J. J.
;
Hsu, S. Y.
;
Lin, L. K.
;
Tsai, T. C.
A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu(0.5)Ni(0.5)/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.
Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement
(2011-01-01)
Huang, S. Y.
;
Liang, J. J.
;
Hsu, S. Y.
;
Lin, L. K.
;
Tsai, T. C.
A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu0.5Ni0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.