Browsing by Author "Lin, Li-Te"

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Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers
(2008-08-13)
Chin, Shu-Cheng
;
Chang, Yuan-Chih
;
Hsu, Chen-Chih
;
Lin, Wei-Hsiang
;
Wu, Chih-I
A two-dimensional (2D) dopant profiling technique is demonstrated in this work. We apply a unique cantilever probe in electrostatic force microscopy (EFM) modified by the attachment of a multiwalled carbon nanotube (MWNT). Furthermore, the tip apex of the MWNT was trimmed to the sharpness of a single-walled carbon nanotube (SWNT). This ultra-sharp MWNT tip helps us to resolve dopant features to within 10 nm in air, which approaches the resolution achieved by ultra-high vacuum scanning tunnelling microscopy (UHV STM). In this study, the CNT-probed EFM is used to profile 2D buried dopant distribution under a nano-scale device structure and shows the feasibility of device characterization for sub-45 nm complementary metal-oxide-semiconductor (CMOS) field-effect transistors.