Browsing by Author "Lin, T. R."

Now showing 1 - 2 of 2

Challenges to global RFID adoption
(2006-12-01)
Wu, N. C.
;
Nystrom, M. A.
;
Lin, T. R.
;
Yu, H. C.
;
科技管理研究所
Because of its potential to revolutionize global supply chain management (SCM) systems, ultra high-frequency (UHF) radio frequency identification (RFID) was recently the cause of much optimism. Wal-Mart mandated its top 100 suppliers to begin using RFID on I January 2005; this day was viewed as a watershed day in the industry. However, that date has come and gone, and the expected rapid industry adoption of RFID has not taken place. This paper explores the existing challenges and obstacles to RFID's quick adoption, the potential resolutions and approaches to the challenges, and the migration strategies to expand the RFID industry. (c) 2005 Elsevier Ltd. All rights reserved.
Wafer Sort Bitmap Data Analysis Using the PCA-Based Approach for Yield Analysis and Optimization
(2010-11-01)
Hsieh, Yeou-lang
;
Tzeng, Gwo-hshiung
;
Lin, T. R.
;
Yu, Hsiao-cheng
;
科技管理研究所
Yield analysis is one of the most important subjects in IC companies. During the initial stage of new process development, several factors can greatly impact the yield simultaneously. Traditionally, several learning cycle iterations are required to solve yield loss issues. This paper describes a novel way to diagnose yield loss issues in less iteration. First, the failure classification of bitmap data is transferred to a new basis using principal component analysis. Second, the defective rates are calculated and the original bitmap data is reconstructed in the principal basis, allowing the yield loss space to be generated by Cluster Analysis. Third, physical failure analysis samples can be selected to solve yield loss issues. Furthermore, the new yield loss basis can be used to monitor the progress of yield improvement as a discriminate analysis measure for reducing failure patterns (bitmap failures).