Browsing by Author "Lin, Taiy-In"

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Effects of thermomechanical properties of polarizer components on light leakage in thin-film transistor liquid-crystal displays
(2015-07-01)
Lin, Taiy-In
;
Chen, Alexander
;
Chen, Shou-I
;
Leu, Jihperng
;
材料科學與工程學系
In this paper, we present static thermal analysis of stress and strain on a thin-film transistor liquid-crystal display (TFT-LCD) panel and their correlation with light leakage phenomena under high-temperature durability test. Three-dimensional (3D) finite element analysis (FEA) is coupled with experimental parameters of key components of the TFT-LCD panel for the analysis. A strong correlation exists between light leakage and retardation difference induced by stress on triacetyl cellulose (TAC) films. Moreover, shrinkage in stretched poly(vinyl alcohol) (PVA) film and modulus of the adhesive layer are key factors affecting stress distribution and displacement of polarizer stack. An increase in Young\'s modulus (E) of the adhesive layer effectively reduces polarizer shrinkage and light leakage at the center of the panel. A TAC film with lower Young\'s modulus and/or coefficient of thermal expansion (CTE) is also an effective solution. (C) 2015 The Japan Society of Applied Physics
Stress and stress relaxation behaviors of multi-layered polarizer structures under a reliability test condition characterized by use of a bending beam technique
(2015-04-01)
Lin, Taiy-In
;
Hsieh, Chih-Yung
;
Li, I-Yin
;
Leu, Jihperng
;
材料科學與工程學系
The bending curvature, stresses, and stress relaxation of various multi-layered structures with different adhesive layers pertaining to the polarizer in a thin-film transistor liquid-crystal display (TFT-LCD) have been successfully characterized by using bending beam technique under reliability test. To be more specific, three different types of pressure-sensitive adhesive (hard-, middle-, and soft-type) and various poly(vinyl alcohol) (PVA) stretched directions are devised to examine to key stress contributors and correlations with light leakage. The shrinkage stress in stretched PVA film and stress relaxation ability of pressure-sensitive adhesives (PSA) layers are found to be the key factors determining the stress distribution and out-of-plane displacement of a polarizer stack. For hard-type PSA, its polarizer stack generates the highest bending curvature with maximum out-of-plane displacement but minimum in-plane displacement, leading to anisotropic stress distribution with high stress around the edges. On the other hand, polarizer stack with soft-type PSA yields the maximum in-plane displacement but the minimum out-of-plane displacement, resulting in isotropic stress distribution. (C) 2015 The Japan Society of Applied Physics