Browsing by Author "Lin, Tzu-Chiang"

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ESD Protection Design for High-Speed Applications in CMOS Technology
(2016-01-01)
Chen, Jie-Ting
;
Lin, Chun-Yu
;
Chang, Rong-Kun
;
Ker, Ming-Dou
;
Tzeng, Tzu-Chien
To prevent from electrostatic discharge (ESD) damages, the ESD protection design must be added on chip. The ESD protection design with low parasitic capacitance is needed for high-speed applications. In this work, an ESD protection design realized by stacked diodes with embedded silicon-controlled rectifier was proposed. Verified in silicon chip, the proposed ESD protection design with lower parasitic capacitance and higher ESD robustness was more suitable for high-speed ESD protection in CMOS technology.