Browsing by Author "Liu, CN"

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Charge transfer in slow collisions of H+ with Na
(2003-07-01)
Le, AT
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Liu, CN
;
Lin, CD
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物理研究所
;
Institute of Physics
We reexamined charge-transfer cross sections for protons colliding with Na(3s) atoms for collision energies from the threshold at 1.7 eV to 40 eV using the recently developed hyperspherical close-coupling method. Our results disagree with the recent calculations by Dutta [Phys. Rev. A 63, 022709 (2001)], but are in good agreement with the earlier calculations of Croft and Dickinson [J. Phys. B 29, 57 (1996)] except at energies below 3 eV. Our calculations support the doubt on the experimental data of Kushawaha.
Efficient coverage analysis metric for HDL design validation
(2001-01-01)
Liu, CN
;
Jou, JY
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電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
Simulation is still the primary approach for the functional verification of register-transfer level circuit descriptions written in hardware description language (HDL). The major problem of the simulation approach is to choose a good metric to gauge the quality of the test patterns. The finite state machine (FSM) coverage test can find most of the design errors in a FSM. However, it is impractical for large designs because of the state explosion problem. In the paper, a higher-level FSM model is proposed to replace the conventional FSM model in the coverage test. The state transition graph can be significantly reduced in the model so that the complexity of the test sets becomes acceptable, even for large designs. This higher-level FSM model, called the semantic finite state machine (SFSM) model, can be easily extracted from the original HDL code automatically with little computation overhead. The advantages of using this model instead of the conventional FSM model in HDL design validation are thoroughly discussed. The implementation results show that it is indeed a promising functional coverage metric.