Browsing by Author "Liu, W-R."

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Recombination dynamics of a localized exciton bound at basal stacking faults within the m-(p)lane ZnO film
(2014-07-07)
Yang, S.
;
Hsu, H. C.
;
Liu, W-R.
;
Lin, B. H.
;
Kuo, C. C.
We investigated the carrier dynamics near basal stacking faults (BSFs) in m-plane ZnO epitaxial film. The behaviors of the type-II quantum wells related to the BSFs are verified through time-resolved and time-integrated photoluminescence. The decay time of the emission of BSFs is observed to have a higher power law value and longer decay time than the emission of the donor-bound excitons. The spectral-dependent decay times reveal a phenomenon of carriers migrating among band tail states, which are related to the spatial distribution of the type-II quantum wells formed by the BSFs. A high density of excited carriers leads to a band bending effect, which in turn causes a blue-shift of the emission peak of BSFs with a broadened distribution of band tail states. (C) 2014 AIP Publishing LLC.