Browsing by Author "Mai, Hung-Chuan"

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Characterization of write-once blu-ray disk containing Cu-Al/Si recording layer using transmission electron microscopy
(2011-02-28)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
Jeng, Shiang-Yao
;
材料科學與工程學系
;
Department of Materials Science and Engineering
Microstructure change in write-once blu-ray disk containing Cu-Al/Si recording layer was investigated by transmission electron microscopy. Nanoscale crystallites were found to comprise of the Cu-Al/Si recording layer before and after signal writing and the energy dispersive spectroscopy revealed insignificant composition fluctuation in disk sample. Analytical results indicated the signal properties of disk samples are correlated with a moderate improvement of crystallinity and the formation of Cu and Si solid-solution phases due to element mixing in mark area, rather than the formation of Cu(3)Si silicide and recrystallization of recording layer as reported by previous studies. (C) 2011 American Institute of Physics. [doi:10.1063/1.3560053]
Microstructure and recording mechanism of Bi-Fe-(N) layer for high-density write-once optical disk
(2008-01-14)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
Jeng, Shiang-Yao
;
Chen, Chong-Ming
;
Wang, Jen-Long
Bi-Fe-(N) thin film as the recording layer of high density digital versatile disk recordable optical disk was developed. For the disk sample with optimized layer structure, maximum partial response signal to noise ratio of 21.1 and minimum simulated bit error rate of 5x10(-7) were achieved at the write power=5.7 mW. Transmission electron microscopy characterization illustrated that the separation of Bi and Fe elements to form the coarse granular structure in the mark regime during laser irradiation comprised of the recording mechanism. (c) 2008 American Institute of Physics.
Nano-composite recording layers applied to write-once high-density optical data storage
(2007-01-01)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
材料科學與工程學系
;
Department of Materials Science and Engineering
This work demonstrates the feasibility of composite thin film containing nano-scale recording particles to high-density optical data storage. For an HD-DVD format "nano"-optical disk containing such a nano-composite layer, modulation higher than 0.5 was achieved when 11T and 4T signals were respectively written into the disk by using a blue-laser dynamic tester. Transmission electron microscopy (TEM) characterization attributed the recording mechanism to the grain coalescence/coarsening and crystallinity change of nano-recording particles which, in turn, results in sufficient reflectivity difference for signal readout. The utilization of nario-composite recording layers may drastically simplify the optical disk structure and thus is a promising alternative for next-generation write-once data recording.
Nano-composite recording layers applied to write-once high-density optical data storage - art. no. 66202F
(2007)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
材料科學與工程學系
;
Department of Materials Science and Engineering
This work demonstrates the feasibility of composite thin film containing nano-scale recording particles to high-density optical data storage. For an HD-DVD format "nano"-optical disk containing such a nano-composite layer, modulation higher than 0.5 was achieved when 11T and 4T signals were respectively written into the disk by using a blue-laser dynamic tester. Transmission electron microscopy (TEM) characterization attributed the recording mechanism to the grain coalescence/coarsening and crystallinity change of nano-recording particles which, in turn, results in sufficient reflectivity difference for signal readout. The utilization of nario-composite recording layers may drastically simplify the optical disk structure and thus is a promising alternative for next-generation write-once data recording.
Phase transition kinetics and recording characteristics of nanocomposite layers prepared by sputtering process utilizing AgInSbTe-SiO(2) composite target
(2008-07-01)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
Huang, Sung-Hsiu
;
Lin, Shoou-Shyan
;
Lee, Tsang-Sheau
AgInSbTe (AIST)-SiO(2) nanocomposite thin films were successfully prepared by sputtering deposition utilizing an AIST-SiO(2) composite target and their phase-transition behaviors were investigated. Transmission electron microscopy (TEM) revealed that the as-deposited composite layer contained nano-scale quaternary alloy particles about 5 nm in size randomly embedded in the SiO(2) matrix. In situ reflectivity-temperature measurements showed that the AIST-SiO(2) nanocomposite and pristine AIST layers exhibit similar abrupt reflectivity changes at about 200 degrees C. However, the presence of the SiO(2) phase hindered particle growth in the nanocomposite layers which, in turn, caused a mild increase in the phase-transition temperatures. Johnson-Mehl-Avrami (JMA) analysis indicated that, regardless of the film thickness, the amorphous-to-crystalline transition in nanocomposite layers proceeds in a bulk-like manner. Dynamic tests revealed that modulations higher than 0.8, 0.6, and 0.5 were achieved when 11T, 4T, and 3T signals, respectively were. written in the one-layer AIST-SiO2 disk sample. The unique phase transition behavior of nanocomposite layers and signal property analysis of disk samples demonstrated that a nanocomposite layer can be a new alternative for write-once optical data storage.
Phase transition kinetics and recording characteristics of nanocomposite layers prepared by sputtering process utilizing AgInSbTe-SiO2 composite target
(2008-07-01)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
Huang, Sung-Hsiu
;
Lin, Shoou-Shyan
;
Lee, Tsang-Sheau
AgInSbTe (AIST)-SiO2 nanocomposite thin films were successfully prepared by sputtering deposition utilizing an AIST-SiO2 composite target and their phase-transition behaviors were investigated. Transmission electron microscopy (TEM) revealed that the as-deposited composite layer contained nano-scale quaternary alloy particles about 5 nm in size randomly embedded in the SiO2 matrix. In situ reflectivity-temperature measurements showed that the AIST-SiO2 nanocomposite and pristine AIST layers exhibit similar abrupt reflectivity changes at about 200 degrees C. However, the presence of the SiO2 phase hindered particle growth in the nanocomposite layers which, in turn, caused a mild increase in the phase-transition temperatures. Johnson-Mehl-Avrami (JMA) analysis indicated that, regardless of the film thickness, the amorphous-to-crystalline transition in nanocomposite layers proceeds in a bulk-like manner. Dynamic tests revealed that modulations higher than 0.8, 0.6, and 0.5 were achieved when 11T, 4T, and 3T signals, respectively were. written in the one-layer AIST-SiO2 disk sample. The unique phase transition behavior of nanocomposite layers and signal property analysis of disk samples demonstrated that a nanocomposite layer can be a new alternative for write-once optical data storage.
Phase-Change Kinetics of Bi-Fe-(N) Layer for High-Speed Write-Once Optical Recording
(2011-04-01)
Huang, Sung-Hsiu
;
Huang, Yu-Jen
;
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
材料科學與工程學系
In this work, we present the phase-change kinetics of Bi-Fe-(N) layers for write-once optical recording. In situ reflectivity measurement indicated that the phase-change temperature (T(x)) of the Bi-Fe-(N) layers is strongly related to the heating rate. The T(x)'s were about 170 degrees C at low heating rates and approached the melting point of the Bi phase (i.e., 271.4 degrees C) at high rate of heating provided by laser heating. For a 100-nm-thick Bi-Fe-(N) layer, Kissinger's analysis showed that the activation energy of phase transition (E(a)) = 1.24 eV, while the analysis of isothermal phase transition in terms of the Johnson-Mehl-Avrami (JMA) theory showed that the average Avrami exponent (m) = 2.2 and the appropriate activation energy (Delta H) = 5.15 eV. With the aid of X-ray diffraction (XRD) analysis, a two-dimensional phase transition behavior in the Bi-Fe-(N) layers initiated by the melting of the Bi-rich phase was confirmed. For optical disk samples with optimized disk structure and write strategy, the signal properties far exceeding the write-once disk test specifications were achieved. Satisfactory signal properties indicated that the Bi-Fe-(N) system is a promising alternative for high-speed write-once recording in the Blu-ray era. (C) 2011 The Japan Society of Applied Physics
Study of Al-Ti/Si bi-layer as the recording media for write-once HD-DVD optical disks
(2009-02-15)
Mai, Hung-Chuan
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Hsieh, Tsung-Eong
;
Jeng, Shiang-Yao
;
Chen, Chong-Ming
;
Wang, Jen-Long
Optimum structure for HD-DVD optical disks containing Al-Ti/Si bi-layer recording system was identified by reflectivity simulation and dynamic test of disk samples. For the disk sample with optimized structure, the maximum partial response signal-to-noise ratio (PRSNR) of 19.1 dB, minimum simulated bit error rate (sbER) of 1.7 X 10(-7) and modulation >0.6 were achieved at the writing power (P(W)) = 11.2 mW. Transmission electron microscopy (TEM) revealed that the polycrystalline granular clusters constitute the recording marks. Subsequent analyses evidenced that element mixing/alloy reactions occur in between Si and Al-Ti layers and the formation of Al(3.21)Si(0.47) crystalline phase is responsible for the signal recording in the disk samples. (C) 2008 Elsevier B.V. All rights reserved.
The nanocomposite thin film applied to high-density write-once optical data storage
(2007-09-01)
Mai, Hung-Chuan
;
Hsieh, Tsung-Eong
;
材料科學與工程學系
;
Department of Materials Science and Engineering
This work demonstrates the feasibility of producing composite thin films containing nano-scale recording particles for highdensity optical data storage. The nanocomposite recording layers were found to exhibit an ultrafast transition rate and a unique phase transition temperature compared with the bilayer recording systems. For type I disk samples containing a nanocomposite recording layer and a Ag reflection layer, modulations higher than 0.8 and 0.5 could be achieved when I IT and 4T signals were respectively written into the disk samples using a blue-laser dynamic tester. As for type 11 disk samples containing a sole nanocomposite recording layer, modulations better than 0.8 and 0.6 were obtained. Transmission electron microscopy (TEM) characterization attributed the main signal recording mechanism to the coalescence and coarsening of nano-recording particles, which, in turn, implies a sufficient reflectivity difference for signal readout. The reactions and/or redistribution of elements involved in the layer structure of optical disks also contributed to the signal recording. The nanocomposite recording layer provides various advantages including a fast phase transition rate, initialization-free, disk structure simplification, and a sputtering-compatible fabrication process and thus, promising applications to next-generation write-once optical data storage are expected.