Browsing by Author "Pai, PF"

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A daily production model for wafer fabrication
(2004-01-01)
Pai, PF
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Lee, CE
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Su, TH
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工業工程與管理學系
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Department of Industrial Engineering and Management
The complex process and high variation in wafer fabrication make its production management very difficult. Problems such as planned target achievement and line balancing are not unusual in the industry. Such problems reveal the importance of developing a daily production policy for wafer fabrication. Planned target achievement and line balancing are the major concerns of this investigation in developing a daily production model. This investigation divides the process of wafer fabrication into two sections, i.e., the front and the rear, according to the last sputtering operation step. In the rear section, the objective is attaining the planned output target. In the front section, the major focus is to satisfy the demand of the rear section so that the production line is balanced. Release and dispatch policies are incorporated in this study to achieve both objectives. A real-world numerical example is used as simulation data. Results show that the proposed daily production model gives a better performance in the achievement of monthly planned output but suffers a little in the performance of line balancing.
Heuristic PAC model for hybrid MTO and MTS production environment
(2003-09-11)
Chang, SH
;
Pai, PF
;
Yuan, KJ
;
Wang, BC
;
Li, RK
Two distinct types of semiconductor plants in Taiwan are integrated device manufacturing (IDM) plants and foundry plants. Most IDM plants are make-to-stock (MTS) operations, focusing on throughput and machine utilization. However, foundry plants are make-to-order (MTO) operations, focusing on due date and cycle time. Besides the challenge of different process technology, the mode of hybrid operation (a combination of MTO and MTS operations) is also a formidable task for these plants. This study develops a heuristic production activity control model to achieve the two different criteria in a hybrid wafer production environment. (C) 2003 Elsevier B.V. All rights reserved.