Browsing by Author "Sang, TH"
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Item type:Item, A new data-aided OFDM symbol timing synchronization algorithm based on histogram processing(2005) ;Sang, TH ;Hsu, SY ;Chen, TL ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA new data-aided OFDM symbol timing synchronization method is developed with two goals in mind: to achieve robust performance and to reduce computational cost. It is the intuitive observation of the relationship between the symbol timing shift and the constellation rotation on each subcarrier of an OFDM symbol from which the new method is developed. A histogram-based algorithm is used to extract the timing shift information from the FFT output. Simulations are conducted to verb the effectiveness and robustness of this new algorithm. Comparison with commonly-used algorithms based on correlation is also provided.Item type:Item, On-wafer noise-parameter measurement using wide-band frequency-variation method(2005-07-01) ;Hu, R ;Sang, TH ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsIn this paper, it is demonstrated that the newly proposed wide-band frequency-variation method, where only one set of matched and mismatched noise measurements is used, can efficiently determine the noise parameters of an ultra-sensitive transistor on-wafer at room temperature. Since the experimental setup is similar to that of conventional noise-temperature measurement while no complicated hardware is employed, this new approach is straightforward, yet efficient, and can be easily extended to applications with much higher or broader frequency ranges. Both the measured noise parameters of the post-amplifier stage and the transistor under test will be presented and investigated.