Browsing by Author "Shen, TL"
Now showing 1 - 3 of 3
- Results Per Page
- Sort Options
Item type:Item, Electroreflectance of surface-intrinsic- n(+)-type doped GaAs(1997-09-15) ;Wang, DP ;Huang, KM ;Shen, TL ;Huang, KFHuang, TCThe electroreflectance spectra of surface-intrinsic-n(+)-type-doped GaAs were measured at various bias voltages (V-bias). Results revealed many Franz-Keldysh oscillations (FKOs) above the band-gap energy, which have been attributed to a uniform electric field (F) in the undoped layer below the surface. However, there has been no other evidence for the uniformity of F in the undoped layer. Since it is known that F can be deduced from the periods of the FKOs, the relations between F and V-bias can, thereby, be obtained. The nearly linear relation, thus found, confirms the existence of a nearly uniform field in the undoped layer. From the plot of F against V-bias,the Values of the thickness of the undoped layer and the barrier height can also be evaluated. (C) 1997 American Institute of Physics.Item type:Item, Electroreflectance of surface-intrinsic- n(+)-type doped GaAs(1997-09-15) ;Wang, DP ;Huang, KM ;Shen, TL ;Huang, KFHuang, TCThe electroreflectance spectra of surface-intrinsic-n(+)-type-doped GaAs were measured at various bias voltages (V-bias). Results revealed many Franz-Keldysh oscillations (FKOs) above the band-gap energy, which have been attributed to a uniform electric field (F) in the undoped layer below the surface. However, there has been no other evidence for the uniformity of F in the undoped layer. Since it is known that F can be deduced from the periods of the FKOs, the relations between F and V-bias can, thereby, be obtained. The nearly linear relation, thus found, confirms the existence of a nearly uniform field in the undoped layer. From the plot of F against V-bias,the Values of the thickness of the undoped layer and the barrier height can also be evaluated. (C) 1997 American Institute of Physics.Item type:Item, The effects of the magnitude of the modulation field on electroreflectance spectroscopy of undoped-n(+) type doped GaAs(1998-01-01) ;Wang, DP ;Huang, KM ;Shen, TL ;Huang, KFHuang, TCThe electroreflectance (ER) spectra of an undoped-n(+) type doped GaAs has been measured at various amplitudes of modulating fields (delta F). Many Franz-Keldysh oscillations were observed above the band gap energy, thus enabling the electric field (F) in the undoped layer to be determined. The F is obtained by applying fast Fourier transformation to the ER spectra. When delta F is small, the power spectrum can be clearly resolved into two peaks, which corresponds to heavy- and light-hole transitions. When delta F is less than similar to 1/8 of the built-in field (F(bi)similar to 77 420 V/cm), the F deduced from the ER is almost independent of delta F. However, when larger than this, F is increased with delta F. Also, when delta F is increased to larger than similar to 1/8 of F-bi, a shoulder appears on the right side of the heavy-hole peak of the power spectrum. The separation between the main peak and the shoulder of the heavy-hole peak becomes wider as delta F becomes larger. (C) 1998 American Institute of Physics.