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Browsing by Author "Shih, Wei-Lun"

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    Dynamic stress effects on the reliability of poly-Si TFT
    (2007)
    Kuo, Yan-Fu
    ;
    Huang, Shih-Che
    ;
    Shih, Wei-Lun
    ;
    Tai, Ya-Hsiang
    ;
    光電工程學系
    The degradation of poly-Si TFT under different gate pulse waveforms is investigated. The mobility degradation is analyzed with the lateral transient electric field and carrier numbers near the channel edges. A proposed index fairly depicts the device degradation, which is helpful in evaluating lifetime for the poly-Si TFT circuits.