Browsing by Author "Su, DC"

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1-to-(NxN) optical fan-out module for optical interconnects
(1997-04-01)
Su, DC
;
Chang, JT
;
Huang, YT
;
電子工程學系及電子研究所
;
光電工程學系
Based on the structure of substrate-mode holograms, a new type of 1-to-(N x N) optical fan-out module which consists of two layers of grating arrays for optical interconnects is presented. The first and second layer have a I x N grating array and a N x N grating array, respectively. By suitably choosing the diffracted angle and diffraction efficiency of every grating, similar diffraction will be performed repeatedly at every grating. Finally, N x N output beams are obtained.
1-to-25 optical fanout module for optoelectronics interconnects
(1996)
Su, DC
;
Chang, JT
;
Huang, YT
;
光電工程學系
;
Department of Photonics
3-port polarization-independent optical quasi-circulator with holographic spatial walk-off polarizers
(2004)
Chen, JH
;
Chen, KH
;
Hsieh, PJ
;
Su, DC
;
光電工程學系
An alternative type of 3-port polarization-independent optical quasi-circulator by utilizing a pair of holographic spatial walk-off polarizers (HSWPs). is proposed. This device consists of a reflection Prism, three polarization beamsplitter cubes, a pair of HSWPs, a Faraday rotator, and a half-wave, plate. The operating principles, the characteristics, and the performances: of this device and HSWPs are discussed. In order to show the validity, the prototype device operating in 1300nm is assembled and tested, experimentally. The merits of this design include polarization-independence, compactness, high isolation, and easy fabrication. It should also be possible to design the device operating at 1550 nm wavelength range.
A four channel polarization and wavelength separation element using substrate-mode stacked holograms
(1996-06-17)
Chang, JT
;
Su, DC
;
Huang, YT
;
電子工程學系及電子研究所
;
光電工程研究所
A four channel polarization and wavelength separation element using substrate-mode stacked holograms is proposed based on the diffraction efficiency characteristics for polarization and the wavelength selectivity of a transmission-type phase volume grating. We fabricated a sample device and measured its polarization selectivity, output spectrum, and insertion loss of each channel to demonstrate its performance. (C) 1996 American Institute of Physics.
A four channel polarization and wavelength separation element using substrate-mode stacked holograms
(1996-06-17)
Chang, JT
;
Su, DC
;
Huang, YT
;
電子工程學系及電子研究所
;
光電工程學系
A four channel polarization and wavelength separation element using substrate-mode stacked holograms is proposed based on the diffraction efficiency characteristics for polarization and the wavelength selectivity of a transmission-type phase volume grating. We fabricated a sample device and measured its polarization selectivity, output spectrum, and insertion loss of each channel to demonstrate its performance. (C) 1996 American Institute of Physics.
A heterodyne interferometer using an electro-optic modulator for measuring small displacements
(1996-01-01)
Su, DC
;
Chiu, MH
;
Chen, CD
;
交大名義發表
;
光電工程學系
In this heterodyne interferometer for measuring small displacements, an electro-optic modulator is used as a frequency shifter. It has some merits, such as, free from the mechanical vibration, simple and compact optical structure, and a general and inexpensive electrical signal processing circuit can be used without decreasing the measuring resolution and easily operated in real time.
A method for measuring Brewster's angle by circularly polarized heterodyne interferometry
(1998-12-01)
Lee, JY
;
Su, DC
;
光電工程學系
;
Department of Photonics
A new method for determining Brewster's angle is proposed based on the effect that the phase difference produced by a simple reflection from the test medium, for a two-frequency circularly polarized light source, is exactly equal to zero when the incident angle equals Brewster's angle. Its best resolution is 10(-3) deg and the validity of the method was demonstrated.
A method for measuring Brewster's angle by circularly polarized heterodyne interferometry
(1998-12-01)
Lee, JY
;
Su, DC
;
光電工程研究所
;
Institute of EO Enginerring
A new method for determining Brewster's angle is proposed based on the effect that the phase difference produced by a simple reflection from the test medium, for a two-frequency circularly polarized light source, is exactly equal to zero when the incident angle equals Brewster's angle. Its best resolution is 10(-3) deg and the validity of the method was demonstrated.
A method for measuring the complex refractive index and thickness of a thin metal film
(2003-12-01)
Chen, KH
;
Hsu, CC
;
Su, DC
;
光電工程學系
;
Department of Photonics
A circularly polarized heterodyne light beam is incident on a thin metal film, causing successive reflections and refractions to occur at the two sides of the thin film. The phase difference between p- and s-polarizations of the multiple-beam interference signal can be measured accurately with an analyzer and heterodyne interferometry. The phase difference depends on the azimuth angle of the analyzer, the complex refractive index and the thickness of the thin metal film. The measured values of the phase differences under three different azimuth angles of the analyzer can be substituted into the special equations derived from Fresnel's equations and multiple-beam interference. Hence, the complex refractive index and the thickness of the thin metal film can be estimated by using a personal computer with a numerical analysis technique. Because of its common-path optical configuration and its heterodyne interferometric phase measurement, this method has many merits, such as high stability against surrounding vibrations, high resolution and easy operation.
A method for measuring the complex refractive index of a turbid medium
(2005)
Jian, ZC
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Lin, JY
;
Hsieh, PJ
;
Chen, HW
;
Su, DC
Based on the heterodyne interferometry and Fresnel equations, an alternative method for measuring the complex refractive index of a turbid medium. A light beam is incident on the boundary between a right-angle prism and a turbid medium. The phase difference between s- and p- polarizations of the reflected light occurs. The phase difference depends on then incident angle and the complex refractive index of a turbid medium-, their relation can be derived from Fresnel equations. The phase difference can be measured accurately with the heterodyne interferometry. Because there are two unknown parameters to be estimated, at least the phase differences under two different conditions should be measured. Then, these measured data are substituted into the derived relation, and a set simultaneous equation is obtained. If the simultaneous equation is solved. the complex refractive index can be estimated. Because the reflected light from the boundary is measured, the scattering noises coming from the turbidity of the tested medium can be greatly reduced. In addition, this method has some merits such as simple optical setup, high sensitivity, high stability, and suitability for a little amount of the tested medium in its native state (without dilution).
A method for measuring the concentration of a solution
(2003)
Su, DC
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Chen, KH
;
Hsu, CC
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交大名義發表
;
National Chiao Tung University
When a linearly polarized light beam enters a surface-plasmon-resonanse (SPR) apparatus and is incident on the boundary surface with tested solution at the resonant angle, the phase difference between s- and p- polarizations is changed with the concentration of the solution. And the phase difference can be measured accurately by the heterodyne interferometry. Based on these effects, a method for measuring the concentration of a solution is presented.
A method for measuring the rotatory power of a chiral medium
(2001)
Su, DC
;
Hsu, CC
;
Lin, JY
;
Lee, JY
;
光電工程學系
A light beam coming from a circularly polarized heterodyne light source passes through a chiral medium, its rotation angle is just half of the phase difference between p- and s- polarization components. And this phase difference can be measured accurately with heterodyne interferometric technique. The rotatory power is obtained by dividing the estimated rotation angle with its path length. This method has many advantages, such as, high stability, high resolution, easy operation, and real-time measurement.
A new method for measuring the chiral parameter and the average refractive index of a chiral liquid
(2003-04-01)
Lin, JY
;
Su, DC
;
光電工程學系
;
Department of Photonics
We designed a method for measuring chiral parameter and average refractive index of an isotropic chiral medium using critical angle phenomena. Linearly polarized light is guided to project onto the interface of a semi-spherical glass and a chiral liquid. The reflected light passes through an analyzer to extract the interference signal of s- and p-polarization lights. Their phase difference is first optimized by a suitable optical arrangement and subsequently measured by a heterodyne interferometer. The result, then, is fed into equations to estimate the chiral parameter. We determine the average index of refraction from the critical angle occurred at the discontinuity of the phase difference of two polarized lights. Our method of measurement has the implicational merits of both common-path interferometry and heterodyne interferometry. (C) 2003 Elsevier Science B.V. All rights reserved.
A new type of optical heterodyne polarimeter
(2003-01-01)
Lin, JY
;
Su, DC
;
光電工程學系
;
Department of Photonics
Phase variations occur when a circularly polarized light beam either passes through a chiral solution or is reflected from a non-absorbing material. They can be measured accurately with a circular heterodyne interferometry. These data are substituted into the special equations derived from Jones calculus. The chiral parameter and the average refractive index of a chiral solution can be estimated simultaneously in just one optical configuration. This polarimeter has the merits of both the common-path interferometer and the heterodyne interferometer. The proposed device was validated in this work.
A substrate-mode holographic collimating and beam shaping element for laser diodes
(1997-02-24)
Chang, JT
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Su, DC
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Huang, ZX
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Huang, YT
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電子物理學系
A new type of substrate-mode holographic collimating and beam shaping element for laser diodes is presented. Techniques and design considerations are described. A sample is fabricated and its function is demonstrated. It has many merits, such as easy fabrication, low cost, compactness of monolithic structure, and is easily used. (C) 1997 American Institute of Physics.
A substrate-mode holographic collimating and beam shaping element for laser diodes
(1997-02-24)
Chang, JT
;
Su, DC
;
Huang, ZX
;
Huang, YT
;
電機學院
A new type of substrate-mode holographic collimating and beam shaping element for laser diodes is presented. Techniques and design considerations are described. A sample is fabricated and its function is demonstrated. It has many merits, such as easy fabrication, low cost, compactness of monolithic structure, and is easily used. (C) 1997 American Institute of Physics.
A wavelength and polarization selector made of holographic polarization beamsplitting cubes for optical communications
(1997-04-07)
Chang, JT
;
Su, DC
;
Huang, YT
;
電子工程學系及電子研究所
;
光電工程學系
We present a combined wavelength-polarization selector made of holographic polarization beamsplitting cubes in series. Each unit cube comprises a pair of prisms and a transmission-type phase volume hologram. The assembled selector, when examined with an intensity modulated beam of known polarization state, demonstrated our designated target. (C) 1997 American Institute of Physics.
Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates
(2005-05-01)
Hsu, CC
;
Lin, JY
;
Chen, KH
;
Su, DC
;
光電工程學系
First, the phase differences between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from the emulsion layer, and that from its substrate, are measured, respectively. The measured data are substituted into specially derived equations, so the refractive indices of the emulsion layer and its substrate can be calculated. Second, the variations of phase differences between s- and p-polarizations due to the wavelength shifts and the extraction of the holographic plate in a modified Michelson interferometer are measured. Then, the thickness of the emulsion layer and its substrate can be estimated based on the measured values of refractive indices, the wavelength shifts, and the phase difference variations. This method has some advantages, such as high resolution and easy operation in only one optical configuration. (c) 2005 Society of Photo-Optical Instrumentation Engineers.
An improved method for measuring refractive-index of a medium
(1998)
Su, DC
;
Lee, JY
;
光電工程學系
;
Department of Photonics
An improved method for measuring the refractive index of a medium is presented. First, the light coming from a circular heterodyne source is incident on the test medium. And, the reflected light passes through an analyzer with the transmission axis at a moderate azimuth angle. Then, the phase variation of the reflected light is measured by the heterodyne interferometric technique. Finally, substituting this phase variation into the equations derived from Fresnel's equations and Jones calculus, we can obtain the refractive index of the test medium.
Angle measurement using total-internal-reflection heterodyne interferometry
(1997-06-01)
Chiu, MH
;
Su, DC
;
交大名義發表
;
光電工程學系
;
National Chiao Tung University
A new optical method for angle measurement based on total-internal-reflection heterodyne interferometry is presented. In this method, heterodyne interferometry is applied to measure the phase difference between s and p polarization states at total internal reflection. This phase difference depends on the angle of incidence. Hence, small-angle measurement can be performed only by evaluating this phase difference. The validity of the method is demonstrated, and it has a measurement range of 10 deg. Its resolution depends on the angle of incidence; the best resolution is 8x10(-5) deg. (C) 1997 Society of Photo-Optical Instrumentation Engineers.