Browsing by Author "Sun, C. T."
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Item type:Item, Deep Learning Based AOI System with Equivalent Convolutional Layers Transformed from Fully Connected Layers(2019-01-01) ;Tsai, Y. H. ;Lyu, N. Y. ;Jung, S. Y. ;Chang, K. H.Chang, J. Y.The rise of deep learning, especially in the realm of computer vision, paves ways of leveraging automatic optical inspection systems to a higher level. Convolutional neural networks and its derivatives might be the most widely used architectures for defect inspection tasks. In real cases the amount of collected data is often not large, so transferring learning and data augmentation are necessary. In this paper, we explain some details how we implement the deep learning based AOI system where fully connected layers are replaced by convolutional layers, then a classification heat map is output after post-processing. We examine the performance of our model with two data sets collected in industrial manufacturing cases. We further propose an idea to transfer models pretrained on augmented data of different sizes cropped from original image to the present classification task for possible improvements of the performance.Item type:Item, Defect Detection on Randomly Textured Surfaces by Convolutional Neural Networks(2018-01-01) ;Jung, S. Y. ;Tsai, Y. H. ;Chiu, W. Y. ;Hu, J. S.Sun, C. T.Automatically detecting the defects on the randomly textured surfaces for industrial purpose is a demanding procedure due to the ambiguity between defects and textures, lack of defect-labeled data and the must-have extreme accuracy. In this paper we proposed a procedure as the beginning of automating the defect detection on woods with randomly textured surfaces by employing 3 different architectures of convolutional neural networks. The deep convolutional neural network resulted in 99.80% accuracy, discriminating among normal wood and the other 4 types of defects images. The models were evaluated and understood by visualizing the saliency maps. The results from our work implies that other industrial images with defects on randomly textured surfaces may apply the similar procedures to accelerate the automating of defect detection and progressing of industry 4.0.Item type:Item, Impact of social behaviors on HIV epidemic: A computer simulation view(2006) ;Sumodhee, C. ;Hsieh, J. L. ;Sun, C. T. ;Huang, C. Y.Chen, Arthur Y. M.HIV/AIDS prevention has been a major concern for health department of every government. We propose to assess the impact of social behaviors on HIV epidemic. To do so, we build an agent-based computer simulation model to implement a sexual network with the existence of high risk population. In order to categorize the high risk population and low risk population, we make use of some criteria such as the number of sexual partners per agent, condom usage, and degree of "faithfulness" towards long-term partners. We also introduce the concept of Free-Links and Fix-Links to denote the short-term and long-term partners' general tendency. We reproduce the epidemic curve of HIV reported cases in the male homosexual community in Taiwan, and try to assess the influence of different policies on the social behavior of each individual and the consequences on the spreading of the epidemic.Item type:Item, Multi-displacement continuum model for discrete systems(2010-12-01) ;Tsai, Jia-Lin ;Huang, Hsin-Haou ;Sun, C. T. ;機械工程學系Department of Mechanical EngineeringA first-order multi-displacement microstructure continuum model is introduced to represent a discrete diatomic lattice system. This model is developed based on a two-term Taylor series expansion of the local displacement of the lattice. It is found that the multi-displacement continuum model obtained by keeping two terms in the Taylor series yields, in general, a better representation of the lattice system than the effective modulus model. However, this microstructure continuum model cannot characterize the negative group velocity of an optical mode of harmonic wave motion in the diatomic lattice. To capture the negative group velocity, a higher-order multi-displacement continuum model is necessary. (C) 2010 Elsevier Ltd. All rights reserved.