Browsing by Author "Sun, W. J."

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Investigation of Electrical Characteristics on 25-nm InGaAs Channel FinFET Using InAlAs Back Barrier and Al2O3 Gate Dielectric
(2017-01-01)
Lin, M. H.
;
Lin, Y. C.
;
Lin, Y. S.
;
Sun, W. J.
;
Chen, S. H.
We investigated an N-type III-V FinFET with a 25-nm In0.53Ga0.47As channel and a 300-nm In0.52Al0.48As barrier layer on an InP substrate. The In0.52Al0.48As barrier layer is used to suppress leakage current from the InP substrate and the 10-nm Al2O3 film deposited by atomic layer deposition (ALD) can be a robust gate dielectric to mitigate interface traps. The on to off current ratio is approximately three orders of magnitude, the subthreshold swing (SS) is 350 mV/dec, and the maximum driving current density is 130 mu A/mu m at V-G = 1.5 V for InGaAs FinFET with a fin width of 40 nm and gate length of 200 nm. (c) 2017 The Electrochemical Society. All rights reserved.