Browsing by Author "Tsai, YM"

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Comprehensive study of convex-louver and wavy fin-and-tube heat exchangers
(1998-07-01)
Wang, CC
;
Tsai, YM
;
Lu, DC
;
機械工程學系
;
Department of Mechanical Engineering
A comprehensive study to investigate the heat transfer and friction characteristics of convex-louver and wavy fin-and-tube heat exchangers was carried out in this study. A total of 14 samples of heat exchangers, including seven convex-louver and seven wavy fin samples having identical waffle heights, were tested and compared in the present investigation. The effects of the number of tube row and fin pitch on the thermal-hydraulic characteristics were also reported. Results were presented as plots of Fanning friction factor f and the Colburn j factor against a Reynolds number based on a tube collar diameter in the range of 3 x 10(2) to 8 x 10(3).
Evaluation on ESD robustness of UPS diode and TFT device by transmission line pulsing (TLP) technique
(2003)
Ker, MD
;
Tseng, TK
;
Yang, SC
;
Shih, A
;
Tsai, YM
ESD robustness of Low Temperature Poly-Si (LTPS) diodes and TFT devices has been investigated in this paper. By using the Transmission Line Pulsing (TLP) techniques, the It2 (secondary breakdown current) of LTPS diodes and TFT devices were measured. To evaluate the ESD robustness of components for ESD protection, the shifts of breakdown voltage and cut-in voltage of LTPS diode and TFT devices after TLP stress are considered into failure threshold judgment. From the experimental results, It2 of LTPS diodes under forward-biased stress is better than that of LTPS TFT devices. Furthermore, the It2 of LTPS TFT devices under reverse-biased stress is more robust than it under forward-biased stress. Such investigation results can help us to design a successful ESD protection for the circuits on glass.