Browsing by Author "Tseng, IS"

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A novel LCD driver testing technique using logic test channels
(2003)
Su, CC
;
Wang, WJ
;
Wang, CH
;
Tseng, IS
;
電控工程研究所
This paper proposes a novel voltage measurement technique for LCD driver testing by the use of logic test channel of an ATE. The method is able to achieve less than 1mV error with the presence of 32mV RMS noise.