Browsing by Author "Tseng, Yuh-Kuang"

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ESD protection design for giga-Hz high-speed I/O interfaces in a 130-nm CMOS process
(2007)
Hsiao, Yuan-Wen
;
Ker, Ming-Dou
;
Chiu, Po-Yen
;
Huang, Chun
;
Tseng, Yuh-Kuang
The electrostatic discharge (ESD) protection design for high-speed input/output (I/O) interfaces in a 130-nm CMOS process is proposed in this paper. First, the ESD protection devices were designed and fabricated to evaluate their ESD robustness and the parasitic effects in giga-hertz: frequency band. VVith the knowledge on the dependence of device dimensions on ESD robustness and the parasitic capacitance, the ESD protection circuit for high-speed I/O interfaces was designed with minimum degradation on high-speed circuit performance but satisfactory high ESD robustness.