Browsing by Author "Tzou, Bo-Wei"

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Method to evaluate afterpulsing probability in single-photon avalanche diodes
(2015-08-15)
Tzou, Bo-Wei
;
Wu, Jau-Yang
;
Lee, Yi-Shan
;
Lin, Sheng-Di
;
電機工程學系
We propose and demonstrate a new method for evaluating the afterpulsing effect in single-photon avalanche photodiodes (SPADs). By analyzing the statistical property of dark count rate, we can quantitatively characterize afterpulsing probability (APP) of a SPAD. In experiment, the temperature-dependent low dark count rate (DCR) distribution becomes non-Poissonian at lower temperature and has higher excess bias as the afterpulsing effect becomes significant. Our work provides a flexible way to examine APP in either single-device or circuit level. (C) 2015 Optical Society of America