Browsing by Author "WEN Charles Hung-Pin"

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INTELLIGENT ANALYSIS METHOD OF LEAKAGE CURRENT DATA FOR CHIP CLASSIFICATION
(2013-07-25)
WEN Charles Hung-Pin
;
CHANG Chia-Ling
An intelligent analysis method of leakage current data for chip classification is provided. The analysis method includes steps of: providing a plurality of given patterns to a chip and measuring a plurality of leakage currents of the chip corresponding to the given patterns; finding a minimum value of the leakage currents and deriving an uninfected process parameter according to the minimum value; calculating a plurality of σ-Iddq values based on the uninfected process parameter and the given patterns; and applying a clustering algorithm to the σ-Iddq values to classify whether the chip is a defect-free one. By employing the novel method, it is advantageous of high efficiency and precision without involving any threshold-value determination, visual inspection and/or pattern modification.
SOFT ERROR PROTECTION DEVICE
(2014-07-31)
WEN Charles Hung-Pin
;
CHANG Chun-Wei
A soft error protection device is disclosed, which comprises a soft error resilient latch (SERL) and a latch coupled to a detection device and receiving a soft error pulse and a clock (CLK) signal respectively outputted by an electronic element and a CLK generator. The SERL delays the soft error pulse. In the period of a negative level of the CLK signal, the SERL stores the delayed soft error pulse corresponding to the negative level and used as a first detection data. Meanwhile, the latch stores the soft error pulse as a second detection data. The detection device receives the CLK signal, the first and second detection datum, and compares the first and second detection datum to send out a detection signal when the CLK signal rises from the negative level to a positive level.