Browsing by Author "Wang, Min-Chuan"

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Effects of ZnO-nanostructure antireflection coatings on sulfurization-free Cu2ZnSnS4 absorber deposited by single-step co-sputtering process
(2013-07-29)
Jheng, Bao-Tang
;
Liu, Po-Tsun
;
Wang, Min-Chuan
;
Wu, Meng-Chyi
;
電子工程學系及電子研究所
ZnO nanostructures as anti-reflective coatings were synthesized by using hydrothermal technique for a sulfurization-free Cu2ZnSnS4 absorber prepared by co-sputtering deposition. By controlling the morphology of solution-grown ZnO nanostructures, the average reflectance of the Cu2ZnSnS4 solar cell with branched ZnO nanorods decreased from 7.6% to 1.12%, and the energy conversion efficiency promoted by 10.4% from the initial value of 4.8% to 5.3%. The efficiency improvement was well studied with the effects of the gradually increased refractive index between the air and the top electrode of Cu2ZnSnS4 solar device, due to the presence of the ZnO nanostructure. (C) 2013 AIP Publishing LLC.
Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment
(2014-01-01)
Chang, Kuan-Chang
;
Chen, Jung-Hui
;
Tsai, Tsung-Ming
;
Chang, Ting-Chang
;
Huang, Syuan-Yong
We demonstrated that the supercritical CO2 fluid treatment was a new concept to efficiently reduce the operation current of resistance random access memory. The dangling bonds of tin-doped silicon oxide (Sn:SiOx) thin film were passivated by the hydration-dehydration reaction through supercritical CO2 fluid treatment, which was verified by the XPS and FTIR analyses. The current conduction mechanism of low resistance state in post-treated Sn:SiOx thin film was transferred to hopping conduction from Ohmic conduction. Furthermore, the current conduction mechanism of high resistance state in the memory device was transferred to Schottky emission from Frenkel-Poole conduction. The phenomena were attributed to the discontinuous metal filament formed by hydration-dehydration reaction in Sn:SiOx thin film through supercritical fluid treatment. Finally, a reaction model was proposed to explain the mechanism of current reduction in Sn:SiOx thin film with supercritical CO2 fluid treatment. Crown Copyright (C) 2013 Published by Elsevier B.V. All rights reserved.