Browsing by Author "Wang, Shao-Cheng"

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An All-Digital Bit Transistor Characterization Scheme for CMOS 6T SRAM Array
(2012)
Lin, Geng-Cing
;
Wang, Shao-Cheng
;
Lin, Yi-Wei
;
Tsai, Ming-Chien
;
Chuang, Ching-Te
We present an all-digital bit transistor characterization scheme for CMOS 6T SRAM array. The scheme employs an on-chip operational amplifier feedback loop to measure the individual threshold voltage (VTH) of 6T SRAM bit cell transistors (holding PMOS, pull-down NMOS, and access NMOS) in SRAM cell array environment. The measured voltage is converted to frequency with dual VCO and counter based digital read-out to facilitate data extraction, processing, and statistical analysis. A 512Kb test chip is implemented in 55nm 1P10M Standard Performance (SP) CMOS technology. Monte Carlo simulations indicate that the accuracy of the VTH measurement scheme is about 2-7mV at TT corner across temperature range from 85 degrees C to -45 degrees C, and post-layout simulations show the resolution of the digital read-out scheme is < 0.2mV per bit. Measured VTH distributions agree well with Monte Carlo simulation results.
Design and Implementation of Dynamic Word-Line Pulse Write Margin Monitor for SRAM
(2012)
Wang, Shao-Cheng
;
Lin, Geng-Cing
;
Lin, Yi-Wei
;
Tsai, Ming-Chien
;
Chiu, Yi-Wei
We present an all-digital monitor structure to measure the Write Margin (WM) with dynamic Word-Line (WL) pulse for standard CMOS 6T SRAM. Ring oscillator and frequency divider based structures are used to generate wide range WL pulses (150ps similar to 32ns) with resolution of 50ps. The bit-line voltage is then successively stepped down for dynamic Write Margin characterization under given word-line pulse width. An improved Skitter based structure is employed to measure the WL pulse width with resolution of 10 similar to 20ps. Implementation of a 256Kb test chip in UMC 55nm Standard Performance (SP) CMOS technology is described.