Browsing by Author "Wu, Yu-Ze"

Now showing 1 - 3 of 3

Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test Cubes
(2010-11-01)
Wu, Yu-Ze
;
Chao, Mango C. -T.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
This article presents several scan-cell reordering techniques to reduce the signal transitions during the test mode while preserving the don't-care bits in the test patterns for a later optimization. Combined with a pattern-filling technique, the proposed scan-cell reordering techniques can utilize both high response correlations and pattern correlations to simultaneously minimize scan-out and scan-in transitions. Those scan-shift transitions can be further reduced by selectively using the inverse connections between scan cells. In addition, the trade-off between routing overhead and power consumption can also be controlled by the proposed scan-cell reordering techniques. A series of experiments are conducted to demonstrate the effectiveness of each of the proposed techniques individually.
Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test Cubes
(2010-11-01)
Wu, Yu-Ze
;
Chao, Mango C. -T.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
This article presents several scan-cell reordering techniques to reduce the signal transitions during the test mode while preserving the don't-care bits in the test patterns for a later optimization. Combined with a pattern-filling technique, the proposed scan-cell reordering techniques can utilize both high response correlations and pattern correlations to simultaneously minimize scan-out and scan-in transitions. Those scan-shift transitions can be further reduced by selectively using the inverse connections between scan cells. In addition, the trade-off between routing overhead and power consumption can also be controlled by the proposed scan-cell reordering techniques. A series of experiments are conducted to demonstrate the effectiveness of each of the proposed techniques individually.
Scan-chain reordering for minimizing scan-shift power based on non-specified test cubes
(2008)
Wu, Yu-Ze
;
Chao, Mango C. -T.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
This paper proposes a scan-cell reordering scheme, named ROBPR, to reduce the signal transitions during test mode while preserving the don't-care bits in the test patterns for a later optimization. Combined with a pattern-filling technique, the proposed scheme utilizes both response correlation and pattern correlation to simultaneously minimize scan-out and scan-in transitions. A series of experiments demonstrate the effectiveness and superiority of the proposed scheme on reducing total scan-shift transitions. The trade-off between our power-driven scan-cell reordering and a routing-driven scan-cell reordering is discussed based on experiments as well.