Browsing by Author "Xuan, Ron"

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Relative Intensity Noise Characteristics of Long-Wavelength Quantum Dot Vertical-Cavity Surface-Emitting Lasers
(2008-08-01)
Peng, Peng-Chun
;
Yeh, Chao-En
;
Kuo, Hao-Chung
;
Xuan, Ron
;
Lin, Chun-Ting
In the study we experimentally investigated the relative intensity noise (RIN) characteristics of a quantum-dot vertical-cavity surface-emitting laser (QD VCSEL). The single-mode QD VCSEL grown on a GaAs substrate is a fully doped structure. Additionally. the resonance frequency of the QD VCSEL with external light injection is as high as 19.2 GHz.