Browsing by Author "Yang, JR"

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High purity nano-crystalline carbon nitride films prepared at ambient temperature by ion beam sputtering
(1999-07-18)
Lu, TR
;
Kuo, CT
;
Yang, JR
;
Chen, LC
;
Chen, KH
High purity nano-crystalline carbon nitride films have been successfully deposited by ion beam sputtering. A novel biomolecular C-N compound, 6-aminopurine, of which the characteristic features include covalent C-N bonding, high N/C ratio and a six-membered ring structure similar to that in the hypothetical C3N4 crystal, has been employed as the target material. The films can be deposited onto a variety of substrate, such as copper, silver, stainless steel, nickel and silicon wafer at ambient temperature. SAM examination indicates a high nitrogen-to-carbon ratio at about 0.51. XPS, IR and Raman studies reveal that the chemical bonding structures consist mainly of sp(3)-hybridized carbon as well as sp(2)-hybridized nitrogen and carbon. Both TEM and SAM mapping investigations indicate that the film contains a very dense and homogenous distribution of nanocrystalline grains. However, the structures of these crystals are yet to be determined since their TEM diffraction patterns only matched partially with the calculated pattern for beta-C3N4. (C) 1999 Elsevier Science S.A. All rights reserved.
Study of InGaN multiple quantum dots by metal organic chemical vapor deposition
(2006-04-01)
Wang, TC
;
Kuo, HC
;
Lu, TC
;
Tsai, CE
;
Tsai, MY
We reports a study of InGaN Multiple quantum dot layers. Using the in-situ SiNx treatment process, InGaN multiple quantum dot layers were successfully developed. The InGaN multiple quantum dot layers were constructed with SiNx dot mask layers, InGaN dot layers, and GaN cap layers on a 2-mu m-thick GaN underlying layer on a sapphire substrate. Optical properties including room temperature photoluminescence (PL), temperature dependent PL, and low power power-dependent PL were examined and discussed. The structure was also analyzed by transmission electron microscopy (TEM) and energy dispersive X-ray (EDX) line scan.