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Browsing by Author "Yen-Ying LIN"

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    METHOD FOR PARAMETER EXTRACTION OF A SEMICONDUCTOR DEVICE
    (2017-08-24)
    Jyh-Chyurn GUO
    ;
    Yen-Ying LIN
    A method is provided for parameter extraction of a semiconductor device with a multi-finger gate. The method includes measuring gate-to-source and gate-to-drain capacitances and performing 3D simulation to compute fringing capacitances, thereby computing an overlap capacitance between the gate and a source/drain extension region, and computing a length of the source/drain extension region according to the overlap capacitance.