Browsing by Author "Yu, Chih-Cheng"
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Item type:Item, Carrier dynamics in InN nanorod arrays(2012-01-16) ;Ahn, Hyeyoung ;Yu, Chih-Cheng ;Yu, Pyng ;Tang, JauHong, Yu-LiangIn this report, we investigated ultrafast carrier dynamics of vertically aligned indium nitride (InN) nanorod (NR) arrays grown by molecular-beam epitaxy on Si(111) substrates. Dominant band filling effects were observed and were attributed to a partial bleaching of absorption at the probe wavelengths near the absorption edge. Carrier relaxation in nanorod samples was strongly dependent on the rod size and length. In particular, a fast initial decay was observed for carriers in NRs with a small diameter (similar to 30 nm), the lifetime of which is much shorter than the carrier cooling time, demonstrating the substantial surface-associated influence on carrier relaxation in semiconductor nanostructures. (C)2012 Optical Society of AmericaItem type:Item, Enhancement of the stability of resistive switching characteristics by conduction path reconstruction(2013-07-22) ;Huang, Jheng-Jie ;Chang, Ting-Chang ;Yu, Chih-Cheng ;Huang, Hui-ChunChen, Yu-TingIn this study, a Pt/BiFeO3/TiN device was fabricated and the resistance switching characteristics were investigated. After the first forming process, the conduction path was formed and exhibited unstable bipolar switching characteristics. Subsequently, the original conduction path was destroyed thoroughly by high negative bias. By reconstructing the conduction path after a second forming process (re-forming process), the device exhibits stable bipolar switching characteristics. Transmission electron microscopy analysis indicates that the stability of switching behavior was enhanced because of the joule heating effect, and is an easy way to improve the resistance switching characteristics. (C) 2013 AIP Publishing LLC.