Browsing by Author "Yuan, Jiann-Shiun"

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Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability
(2012-06-01)
Yuan, Jiann-Shiun
;
Yen, Hsuan-Der
;
Chen, Shuyu
;
Wang, Ruey-Lue
;
Huang, Guo-Wei
A cascode class-E power amplifier (PA) operating at 5.2 GHz has been designed using Advanced Design System simulation. RF circuit performances such as output power and power-added efficiency before and after RF stress have been experimentally investigated. The measured output power, power-added efficiency, and linearity after high-input-power RF stress at elevated supply voltage show significant circuit degradations. The impact of hot-carrier injection and gate oxide soft breakdown on cascode class-E PA reliability is discussed.