Browsing by Author "Zhong, C. W."
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Item type:Item, Stability of High Performance p-type SnO TFTs(2015) ;Zhong, C. W. ;Tsai, H. Y. ;Lin, H. C. ;Liu, K. C.Huang, T. Y.High performance p-type SnO TFTs were fabricated and characterized in this work. Owing to thermal oxygen annealing process, the originally tin-rich oxide film was transformed into a polycrystalline SnO, resulting in decent field-effect mobility and high on/off current ratio. Electrical stability was evaluated by examining the threshold voltage shift under negative bias stresses at different stress times. A scenario considering the passivation/de-passivation of acceptor defects in the channel and the hole trapping of the gate oxide is proposed to explain the observed instability of the SnO TFTs.