瀏覽 的方式： 作者 Hsu, S. L.
顯示 1 到 4 筆資料，總共 4 筆
| 公開日期 | 標題 | 作者 |
| 2007 | Impact of self-heating effect on hot carrier degradation in high-voltage LDMOS | Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2006 | Investigation of hot carrier degradation modes in LDMOS by using a novel three-region charge pumping technique | Cheng, C. C.; Tu, K. C.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Sam C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-2006 | Physics and characterization of various hot-carrier degradation modes in LDMOS by using a three-region charge-pumping technique | Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2014 | Pressure effect and electron diffraction on the anomalous transition in ternary superconductor Bi2Rh3Se2 | Chen, C. Y.; Chan, C. L.; Mukherjee, S.; Chou, C. C.; Tseng, C. M.; Hsu, S. L.; Chu, M. -W.; Lin, J. -Y.; Yang, H. D.; 物理研究所; Institute of Physics |
