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Browsing by Author Hsu, S. L.

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Issue DateTitleAuthor(s)
2007Impact of self-heating effect on hot carrier degradation in high-voltage LDMOSCheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006Investigation of hot carrier degradation modes in LDMOS by using a novel three-region charge pumping techniqueCheng, C. C.; Tu, K. C.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Sam C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2006Physics and characterization of various hot-carrier degradation modes in LDMOS by using a three-region charge-pumping techniqueCheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2014Pressure effect and electron diffraction on the anomalous transition in ternary superconductor Bi2Rh3Se2Chen, C. Y.; Chan, C. L.; Mukherjee, S.; Chou, C. C.; Tseng, C. M.; Hsu, S. L.; Chu, M. -W.; Lin, J. -Y.; Yang, H. D.; 物理研究所; Institute of Physics
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