1. 目前位置：

瀏覽 的方式： 作者 Huang, Hsuan-Ming

跳到： 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
或是輸入前幾個字：  
顯示 1 到 15 筆資料，總共 15 筆
公開日期標題作者
2007Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperatureLi, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang; 電信工程研究所; Institute of Communications Engineering
2008Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET DevicesHwang, Chih-Hong; Cheng, Hui-Wen; Yeh, Ta-Ching; Li, Tien-Yeh; Huang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
2010Computational Statistics Approach to Capacitance Sensitivity Analysis and Gate Delay Time Minimization of TFT-LCDsLi, Yiming; Huang, Hsuan-Ming; 電信工程研究所; Institute of Communications Engineering
2007Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI DevicesLi, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; Yeh, Ta-Ching; 電信工程研究所; Institute of Communications Engineering
2007Discrete Dopant Induced Electrical and Thermal Fluctuation in Nanoscale SOI FinFETLi, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; 電信工程研究所; Institute of Communications Engineering
1-三月-2013Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge CollectionHuang, Hsuan-Ming; Wen, Charles H. -P.; 交大名義發表; 傳播研究所; 電機資訊學士班; 電機工程學系; National Chiao Tung University; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science; Department of Electrical and Computer Engineering
1-六月-2008Large-scale "atomistic" approach to discrete-dopant-induced characteristic fluctuations in silicon nanowire transistorsLi, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; 電信工程研究所; Institute of Communications Engineering
四月-2016Layout-Based Soft Error Rate Estimation Framework Considering Multiple Transient Faults-From Device to Circuit LevelHuang, Hsuan-Ming; Wen, Charles H. -P.; 電機學院; College of Electrical and Computer Engineering
2009Parameterized Display Performances Behavioral Modeling and Optimization for TFT-LCD PanelHuang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
2008Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS CircuitLi, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching; Huang, Hsuan-Ming; Li, Tien-Yeh; Cheng, Hui-Wen; 電信工程研究所; Institute of Communications Engineering
1-一月-2012Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS DesignsPeng, Huan-Kai; Huang, Hsuan-Ming; Kuo, Yu-Hsin; Wen, Charles H. -P.; 電機工程學系; Department of Electrical and Computer Engineering
2007Three-dimensional simulation of random-dopant-induced threshold voltage fluctuation in nanoscale Fin-typed field effect transistorsLi, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; 資訊工程學系; Department of Computer Science
2009A Unified Parameterization Technique for TFT-LCD Panel Design OptimizationHuang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
2010分析在全電量之粒子影響下之統計性軟性電子錯誤率黃宣銘; Huang, Hsuan-Ming; 溫宏斌; Wen, Hung-Pin; 電信工程研究所
2015軟性電子錯誤之進階效應分析-從元件層級到電路層級黃宣銘; Huang, Hsuan-Ming; 溫宏斌; 電機工程學系
顯示 1 到 15 筆資料，總共 15 筆