| Issue Date | Title | Author(s) |
| 2007 | Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperature | Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; Yeh, Ta-Ching; Cheng, Hui-Wen; Chen, Hung-Ming; Hwang, Jiunn-Ren; Yang, Fu-Liang; 電信工程研究所; Institute of Communications Engineering |
| 2008 | Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET Devices | Hwang, Chih-Hong; Cheng, Hui-Wen; Yeh, Ta-Ching; Li, Tien-Yeh; Huang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering |
| 2010 | Computational Statistics Approach to Capacitance Sensitivity Analysis and Gate Delay Time Minimization of TFT-LCDs | Li, Yiming; Huang, Hsuan-Ming; 電信工程研究所; Institute of Communications Engineering |
| 2007 | Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices | Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; Yeh, Ta-Ching; 電信工程研究所; Institute of Communications Engineering |
| 2007 | Discrete Dopant Induced Electrical and Thermal Fluctuation in Nanoscale SOI FinFET | Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; 電信工程研究所; Institute of Communications Engineering |
| 1-Mar-2013 | Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection | Huang, Hsuan-Ming; Wen, Charles H. -P.; 交大名義發表; 傳播研究所; 電機資訊學士班; 電機工程學系; National Chiao Tung University; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science; Department of Electrical and Computer Engineering |
| 1-Jun-2008 | Large-scale "atomistic" approach to discrete-dopant-induced characteristic fluctuations in silicon nanowire transistors | Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; 電信工程研究所; Institute of Communications Engineering |
| Apr-2016 | Layout-Based Soft Error Rate Estimation Framework Considering Multiple Transient Faults-From Device to Circuit Level | Huang, Hsuan-Ming; Wen, Charles H. -P.; 電機學院; College of Electrical and Computer Engineering |
| 2009 | Parameterized Display Performances Behavioral Modeling and Optimization for TFT-LCD Panel | Huang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering |
| 2008 | Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS Circuit | Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching; Huang, Hsuan-Ming; Li, Tien-Yeh; Cheng, Hui-Wen; 電信工程研究所; Institute of Communications Engineering |
| 1-Jan-2012 | Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs | Peng, Huan-Kai; Huang, Hsuan-Ming; Kuo, Yu-Hsin; Wen, Charles H. -P.; 電機工程學系; Department of Electrical and Computer Engineering |
| 2007 | Three-dimensional simulation of random-dopant-induced threshold voltage fluctuation in nanoscale Fin-typed field effect transistors | Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming; 資訊工程學系; Department of Computer Science |
| 2009 | A Unified Parameterization Technique for TFT-LCD Panel Design Optimization | Huang, Hsuan-Ming; Li, Yiming; 電信工程研究所; Institute of Communications Engineering |
| 2010 | 分析在全電量之粒子影響下之統計性軟性電子錯誤率 | 黃宣銘; Huang, Hsuan-Ming; 溫宏斌; Wen, Hung-Pin; 電信工程研究所 |
| 2015 | 軟性電子錯誤之進階效應分析-從元件層級到電路層級 | 黃宣銘; Huang, Hsuan-Ming; 溫宏斌; 電機工程學系 |
