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dc.contributor.authorKwei, C. M.en_US
dc.contributor.authorLi, Y. C.en_US
dc.contributor.authorTung, C. J.en_US
dc.date.accessioned2014-12-08T15:15:48Z-
dc.date.available2014-12-08T15:15:48Z-
dc.date.issued2006-09-15en_US
dc.identifier.issn0039-6028en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.susc.2006.01.071en_US
dc.identifier.urihttp://hdl.handle.net/11536/11771-
dc.description.abstractWhen fast electrons cross a solid surface, surface plasmons may be generated. Surface plasmon excitations induced by electrons moving in the vacuum are generally characterized by the surface excitation parameter. This parameter was calculated for 200-1000 eV electrons crossing the surfaces of An, Cu, Ag, Fe, Si, Ni, Pd, MgO and SiO, with various crossing angles. Such calculations were performed based on the dielectric response theory for both incident (from vacuum to solid) and escaping (from solid to vacuum) electrons. Calculated results showed that the surface excitation parameter increased with crossing angle but decreased with electron energy. This was due to the longer time for electron-surface interaction by glancing incident or escaping electrons and by slow moving electrons. The results were fitted very well to a simple formula, i.e. P-s = aE(-b)/(cosx)(c), where P, is the surface excitation parameter, E is the electron energy, alpha is the angle between the electron trajectory and the surface normal, and a, b and c are material dependent constants. (c) 2006 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectelectronen_US
dc.subjectsurface excitation parameteren_US
dc.subjectglancing angleen_US
dc.titleAngular and energy dependences of the surface excitation parameter for electrons crossing a solid surfaceen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.susc.2006.01.071en_US
dc.identifier.journalSURFACE SCIENCEen_US
dc.citation.volume600en_US
dc.citation.issue18en_US
dc.citation.spage3690en_US
dc.citation.epage3694en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000241450600036-
Appears in Collections:Conferences Paper


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