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dc.contributor.authorFeng, Zhe Chuanen_US
dc.contributor.authorJiang, Xiaodongen_US
dc.contributor.authorLee, Yueh-Chienen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorWan, Lingyuen_US
dc.date.accessioned2017-04-21T06:50:09Z-
dc.date.available2017-04-21T06:50:09Z-
dc.date.issued2016en_US
dc.identifier.isbn978-1-5090-2439-1en_US
dc.identifier.issn2378-8593en_US
dc.identifier.urihttp://hdl.handle.net/11536/134353-
dc.description.abstractTo explore the mechanism, breakthrough the current bottleneck and overcome the efficiency droop from green InGaN/GaN multiple quantum wells (MQWs) light-emitting diodes (LEDs). The photoluminescence properties and carrier dynamics of green InGaN/GaN MQW LEDs are investigated by temperature-dependent photoluminescence (PL) from 10 K to 300 K and time-resolved PL (TRPL) measurements at 10 K in our new-built lab. With increasing temperature, a blue shift of PL behavior is attributed to band-tail states formed in local potential minima resembling In-rich clusters. The energy-dependent TRPL experiments are measured at 10 K to study the carrier dynamics in the MQWs. The results show that the PL slow decays for the low-energy side are much slower than the high-energy side. The depth of carrier localization is obtained by fitting the reduced slow decay time with the emission energy increasing. All the results indicate that the PL peak is related to localized radiative recombination.en_US
dc.language.isoen_USen_US
dc.subjectInGaN/GaN MQWsen_US
dc.subjectTRPLen_US
dc.subjectcarrier dynamicsen_US
dc.subjectemission propertiesen_US
dc.titleGreen Light-emitting Diodes with InGaN/GaN Multiple Quantum Well Structures: Time-resolved Photoluminescence, Emission Dynamics and Related Studiesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2016 5TH INTERNATIONAL SYMPOSIUM ON NEXT-GENERATION ELECTRONICS (ISNE)en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000390432600110en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper