Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Gao, Peng | en_US |
dc.contributor.author | Zhang, Zhangyuan | en_US |
dc.contributor.author | Li, Mingqiang | en_US |
dc.contributor.author | Ishikawa, Ryo | en_US |
dc.contributor.author | Feng, Bin | en_US |
dc.contributor.author | Liu, Heng-Jui | en_US |
dc.contributor.author | Huang, Yen-Lin | en_US |
dc.contributor.author | Shibata, Naoya | en_US |
dc.contributor.author | Ma, Xiumei | en_US |
dc.contributor.author | Chen, Shulin | en_US |
dc.contributor.author | Zhang, Jingmin | en_US |
dc.contributor.author | Liu, Kaihui | en_US |
dc.contributor.author | Wang, En-Ge | en_US |
dc.contributor.author | Yu, Dapeng | en_US |
dc.contributor.author | Liao, Lei | en_US |
dc.contributor.author | Chu, Ying-Hao | en_US |
dc.contributor.author | Ikuhara, Yuichi | en_US |
dc.date.accessioned | 2019-04-03T06:41:05Z | - |
dc.date.available | 2019-04-03T06:41:05Z | - |
dc.date.issued | 2017-06-06 | en_US |
dc.identifier.issn | 2041-1723 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1038/ncomms15549 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/144074 | - |
dc.description.abstract | Although the size effect in ferroelectric thin films has been known for long time, the underlying mechanism is not yet fully understood and whether or not there is a critical thickness below which the ferroelectricity vanishes is still under debate. Here, we directly measure the thickness-dependent polarization in ultrathin PbZr0.2Ti0.8O3 films via quantitative annular bright field imaging. We find that the polarization is significantly suppressed for films <10-unit cells thick (similar to 4 nm). However, approximately the polarization never vanishes. The residual polarization is similar to 16 mu Ccm(-2) (similar to 17%) at 1.5-unit cells (similar to 0.6 nm) thick film on bare SrTiO3 and similar to 22 mu Ccm(-2) at 2-unit cells thick film on SrTiO3 with SrRuO3 electrode. The residual polarization in these ultrathin films is mainly attributed to the robust covalent Pb-O bond. Our atomic study provides new insights into mechanistic understanding of nanoscale ferroelectricity and the size effects. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1038/ncomms15549 | en_US |
dc.identifier.journal | NATURE COMMUNICATIONS | en_US |
dc.citation.volume | 8 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000415055000001 | en_US |
dc.citation.woscount | 16 | en_US |
Appears in Collections: | Articles |
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