標題: Ultrathin limit and dead-layer effects in local polarization switching of BiFeO3
作者: Maksymovych, Peter
Huijben, Mark
Pan, Minghu
Jesse, Stephen
Balke, Nina
Chu, Ying-Hao
Chang, Hye Jung
Borisevich, Albina Y.
Baddorf, Arthur P.
Rijnders, Guus
Blank, Dave H. A.
Ramesh, Ramamoorthy
Kalinin, Sergei V.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 31-一月-2012
摘要: Using piezoresponse force microscopy in an ultrahigh vacuum, polarization switching has been detected and quantified in epitaxial BiFeO3 films from 200 to about 4 unit cells thick. Local remnant piezoresponse was utilized to probe both ferroelectric properties and effects of imperfect electrical contacts. It was found that the shape of electromechanical hysteresis loops is strongly influenced by an extrinsic dielectric gap, primarily through the suppressing effect of the depolarizing field on the spontaneous polarization in the ultrathin films. Furthermore, statistical analysis of the hysteresis loops has revealed lateral variation of the extrinsic dielectric gap with sub-10-nm resolution. Robust and reproducible ferroelectric properties of nanoscale BiFeO3 indicate its potential for nanoscale applications in information storage and spintronics.
URI: http://dx.doi.org/10.1103/PhysRevB.85.014119
http://hdl.handle.net/11536/15248
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.85.014119
期刊: PHYSICAL REVIEW B
Volume: 85
Issue: 1
起始頁: 0
結束頁: 0
顯示於類別:期刊論文


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