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dc.contributor.authorYen, Miao-Chiangen_US
dc.contributor.authorChang, Shih-Yien_US
dc.contributor.authorChang, Li-Pinen_US
dc.date.accessioned2019-04-02T05:59:46Z-
dc.date.available2019-04-02T05:59:46Z-
dc.date.issued2018-11-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2018.2857322en_US
dc.identifier.urihttp://hdl.handle.net/11536/148343-
dc.description.abstractRecently, smartphone users are becoming reluctant to replace their devices, so providing reliable data storage throughout the increasingly long smartphone replacement cycle is an imminent challenge. We advocate an integrated approach to data deduplication, which involves the host I/O stack and the storage firmware, to reduce the write stress of mobile storage for lifespan extension. First, we identified that the SQLite library produces a large amount of copy-induced duplicate data, which can be fully revealed to the mobile storage through proper file format alignment. Second, inspired by the short flash read latency, we present a firmware-based method to efficiently identify duplicate data without any hardware support. Third, we enhance the flash garbage collector with the awareness of data deduplication. Based on a selection of popular mobile applications, our simulation results show that prior methods, which employ data compression or differential logging, are ineffective for encrypted mobile storage. Compared to flash management without deduplication, our lightweight, integrated approach reduced the total flash-block erase count by 48.7%, average write response time by 43.8%, and total energy consumption by 25.1% on average under the workloads of all the selected mobile applications.en_US
dc.language.isoen_USen_US
dc.subjectAndroiden_US
dc.subjectdata deduplicationen_US
dc.subjectflash memoryen_US
dc.subjectmobile storageen_US
dc.subjectoperating systemsen_US
dc.titleLightweight, Integrated Data Deduplication for Write Stress Reduction of Mobile Flash Storageen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCAD.2018.2857322en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume37en_US
dc.citation.spage2590en_US
dc.citation.epage2600en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000447854500037en_US
dc.citation.woscount0en_US
Appears in Collections:Articles