Improving the Accuracy of Automated GUI Testing for Embedded Systems

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DC Field	Value	Language
dc.contributor.author	Lin, Ying-Dar	en_US
dc.contributor.author	Chu, Edward T. -H.	en_US
dc.contributor.author	Yu, Shang-Che	en_US
dc.contributor.author	Lai, Yuan-Cheng	en_US
dc.date.accessioned	2014-12-08T15:35:38Z	-
dc.date.available	2014-12-08T15:35:38Z	-
dc.date.issued	2014-01-01	en_US
dc.identifier.issn	0740-7459	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/MS.2013.100	en_US
dc.identifier.uri	http://hdl.handle.net/11536/24056	-
dc.language.iso	en_US	en_US
dc.title	Improving the Accuracy of Automated GUI Testing for Embedded Systems	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1109/MS.2013.100	en_US
dc.identifier.journal	IEEE SOFTWARE	en_US
dc.citation.volume	31	en_US
dc.citation.issue	1	en_US
dc.citation.spage	39	en_US
dc.citation.epage	45	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:000332601500009	-
dc.citation.woscount	1	-
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